Аналитические приборы и лабораторное оборудование, газовые хроматографы, хромато-масс-спектрометры, газохроматографические анализаторы, приборы для ВЭЖХ, высокоэффективные жидкостные хроматографы, препаративные жидкостные хроматографы, ИК-Фурье спектрометры, Рамановские спектрометры, БИК спектрометры, промышленные БИК анализаторы пищевых продуктов, УФ спектрофотометры, флуориметры, спектрофлуориметры, атомно-абсорбционные спектрофотометры, элементные анализаторы, рентгенофлуоресцентные спектрометры для анализа металла, оптико-эмиссионные анализаторы элементного состава металлов, сплавов, спектрометры ИСП, масс-спектрометры, газоаналитические приборы, масс-спектрометрические газоанализаторы.
Manufacturers and suppliers of X-ray spectroscopy equipment, X-ray fluorescence spectrometry instruments, X-ray diffraction instruments (X-ray fluorescence spectrometers, portable XRF spectrometers, X-ray fluorescence spectrometers for metal sorting, alloy checking, handheld portable XRF metal analyzers, X-ray fluorescence spectrometers for precious metals analysis, XRF gold analyzers, X-ray fluorescence sulfur-in-oil analyzers, XRF total sulphur analyzers, process X-ray fluorescence spectrometers, process XRF analyzers, X-ray fluorescence spectrometers for surface microanalysis, element mapping and imaging, X-ray microanalysis systems, X-ray microspectrometers, XRF microanalyzer systems, X-ray diffractometers, XRD systems). Производители и поставщики оборудования, приборов для рентгенофлуоресцентного анализа, рентгеноструктурного анализа (рентгенофлуоресцентные спектрометры, портативные, ручные рентгенофлуоресцентные спектрометры, рентгенофлуоресцентные анализаторы состава металла, марки сплава, спектрометры для определения содержания драгоценных металлов, золота в сплавах, рентгенофлуоресцентные анализаторы содержания серы в нефти, нефтепродуктах, промышленные рентгенофлуоресцентные анализаторы, рентгенофлуоресцентные аналитические микроскопы, рентгеновские микроспектрометры, рентгеновские дифрактометры.
Manufacturers and suppliers of X-ray microanalysis systems, micro XRF analyzers (X-ray microanalysis instrumentation, WD X-ray spectrometers, ED X-ray spectrometers, XRF microspectrometers, X-ray fluorescence spectrometers for surface microanalysis, element mapping and imaging). Производители и поставщики рентгеновских микроаналитических систем, микро-рентгенофлуоресцентных спектрометров для элементного микроанализа поверхности материалов, элементного картирования, визуализации химического состава поверхности.
International companies index. Международный указатель компаний.
Bruker Corporation.
Bruker is a manufacturer of quadrupole, ITD, TOF mass-spectrometers, GC/MS, MS/MS, LC/MS/MS systems, FTIR, FT-NIR, Raman spectrometers, NMR, EPR spectrometers, NMR analyzers, X-ray fluorescence spectrometers, portable XRF analyzers, X-ray diffractometers, single crystal diffraction instruments (XRD, SCD systems), spark-OES metal analyzers, combustion elemental analyzers, portable ion mobility spectrometers, portable FTIR analyzers, biological, chemical and nuclear detection instruments. Bruker Scientific Instruments Division (Bruker AXS, Bruker BioSpin, Bruker Daltonics, Bruker Optics) offers a broad range of instruments and solutions for analytical chemistry, life sciences, clinical research, materials research, environmental analysis, forensics, lab automation, process control, quality control.
Bruker AXS manufactures a broad range of X-ray fluorescence spectrometers for quantitative elemental analysis, portable XRF spectrometers (handheld XRF analyzers), X-ray fluorescence microanalysis instruments (micro-XRF spectrometers, X-ray microanalysis systems), X-ray diffraction instruments, single crystal diffraction systems (SCD systems), and X-ray components (X-ray sources, detectors, X-ray optics). Bruker AXS also manufactures sparc optical emission spectrometers for metal analysis (spark OES metal analyzers) and combustion analyzers for metals. Bruker AXS manufactures atomic force microscopes / scanning probe microscopes (AFM/SPM systems). Bruker AXS offers radionuclide spectrometers.
CAMECA.
CAMECA (France) is a manufacturer of surface microanalysis and elemental mapping instruments for research, materials science, geology, geosciences, semiconductors, and metrology equipment for semiconductor industry. CAMECA is a business unit of the AMETEK Materials Analysis Division. CAMECA manufactures low energy X-ray emission spectrometry systems, SIMS microprobe analyzers, secondary ion mass spectrometry systems for semiconductors materials science and geosciences, EPMA, electron probe microanalysis systems for materials science and geosciences, laser assisted tomographic atom probe microanalysis and imaging systems for materials and semiconductors. The CAMECA instruments provide elemental and isotopic composition data from micron down to sub-nanometer scale. The company manufactures a broad range of secondary ion mass spectrometers for surface microanalysis: universal magnetic sector SIMS system for materials and semiconductors, magnetic sector SIMS system for advanced semiconductors, magnetic sector SIMS system for geoscience laboratories, ultra high sensitivity magnetic sector SIMS system for geoscience labs, high performance SIMS system for isotopic and trace element analysis at high spatial resolution, universal quadrupole SIMS system for semiconductors and materials, shielded magnetic sector SIMS system for radioactive samples (on request). CAMECA manufactures laser assisted tomographic atom probe microanalysis and imaging system providing quantitative atomic scale 3D elemental mapping of chemical heterogeneities in materials. Laser assisted tomographic atom probe microanalysis and imaging system features atomic scale depth resolution in semiconductors, excellent mass resolution even on low thermal conductivity materials, large area of analysis (up to 100 nm in diameter) for a better statistics on composition measurements, flexible and fast dedicated FIM (field ion microscopy) detector for metallurgical applications. CAMECA manufactures electron probe microanalysis system (EPMA system) for materials science and geosciences. Electron probe microanalysis system featured fully integrated optical microscope, up to 5 wavelength dispersive spectrometers (WDXRF spectrometers), + energy dispersive spectrometer (EDXRF spectrometer), high voltage electron gun operates at up to 40 kV for elements with high atomic number, trace element measurements and high speed X-ray mapping. Also manufactures shielded electron probe microanalysis system for radioactive samples. Electron probe microanalyzer system are equipped with a complete kit of built-in microscopy tools that allow simultaneous X-ray (WDXRF and EDXRF), SEM and BSE imaging. CAMECA manufatures process control systems for the semiconductor manufacturing industry (metrology tools): in-line low energy X-ray emission spectrometer system, near-line full wafer magnetic sector SIMS analyzer, automated, full wafer quadrupole SIMS analyzer.
EDAX.
EDAX (a member of the AMETEK Materials Analysis Division) is a manufacturer of micro-XRF analyzers, EDS and WDS detectors for SEM systems, TEM systems (X-ray microanalysis systems for electron microscopes), EBSD systems for scanning electron microscopes (crystallography, microstructural analysis using electron backscatter diffraction). EDAX manufactures wavelength dispersive X-ray spectrometers that will fit on all electron microscopes (SEM, TEM systems). EDAX also manufactures integrated material characterization systems: EDS + EBSD system, EDS + WDS system, EDS + EBSD + WDS system. EDAX manufactures micro-XRF analyzers (micro-XRF spectrometers)- X-ray microanalysis instruments for non-destructive micro-spot elemental analysis, coating thickness and composition measurements, quality control in microelectronic industry, RoHS, geology, mineralogy, forensic inquiry.
FEI Company.
FEI Company is a manufacturer of scanning electron microscopes (SEM systems), transmission electron microscopes (TEM systems), dualbeams instruments (SEM/FIB systems), and focused ion beam instruments (FIB systems). FEI Company manufactures scanning electron microscopes (SEM systems) with EBIC, STEM, EDS, WDS, EBSD, and field emission gun (FEG/SEM) capabilities. FEI Company manufactures transmission electron microscopes (TEM systems) and scanning / transmision electron microscopes (S/TEM systems). FEI Company manufactures FIB/SEM systems for transmission electron microscope sample preparation (TEM sample preparation), microanalysis, 3D microscopy, 3D defect characterization, failure analysis, industrial failure analysis, process control applications, and . The FIB/SEM systems features three SEM imaging modes (high vacuum, low vacuum, ESEM), integrated focused ion beam (FIB) adds cross sectioning capabilities. ESEM mode allows in situ study of the dynamic behavior of materials at different humidity levels (up to 100% RH) and temperatures (up to 1500° C). FEI Company offers full wafer DualBeam microscopes with 300mm capability for fast and accurate 3D defect characterization, failure analysis and transmission electron microscope (TEM) sample preparation. FEI Company manufactures defect analyzer system combining tool automation, electron imaging, focused ion beam milling, and proprietary beam chemistry technology to enable three-dimensional analysis of advanced process defects. FEI Company manufactures focused ion beam systems (FIB systems) provides effective cross-sectioning, imaging and transmission electron microscopy (TEM) sample preparation.
Gatan, Inc.
Gatan manufactures instrumentation and software used to enhance and extend the operation and performance of electron microscopes (SEM, TEM systems). Gatan is a manufacturer of spectrometers, spectrum imaging devices for SEM and TEM systems, X-Ray microscopes, specimen preparation equipment, specimen holders for transmission electron microscopy. Gatan manufactures a range of analytical holders, cooling and cryo transfer holders, environmental cell and vacuum transfer holders, heating, straining and multiple specimen transfer holders and tomography holders. Gatan manufactures cooled CCD cameras for transmission electron microscopes (CCD cameras provides a TEM with both high-resolution digital imaging and analytical capabilities). Gatan manufactures electron energy loss spectroscopy (EELS) and energy-filtered TEM (EFTEM) systems for analytical TEM applications. Spectrometer systems for analytical TEM provides information about material samples probed by a transmitted electron beam, including sample thickness, elemental and chemical composition, electronic structure and energy levels, frequency-dependent dielectric response, and element-specific radial distribution of atoms. Gatan offers devices and software to enhance and support scanning-mode TEM (STEM) analysis, including digital beam scan and imaging systems, STEM detectors optimized for the STEM EELS technique, EDS data acquisition and analysis software, spectral imaging and analysis software. Gatan manufactures cathodoluminescence imaging systems, spectroscopy and spectrum imaging systems, cryo-SEM equipment. Gatan offers software suite for EELS and EFTEM compositional mapping, TEM auto-tuning, diffraction pattern analysis, and 3D tomography-acquisition. Gatan manufactures a specially designed ultra-microtome for life science researchers, operating in situ within a variable pressure, field emission SEM, allowing automated acquisition of 3D ultrastructure by sequentially imaging the freshly cut, resin embedded block face. Gatan also manufactures the SEM-hosted high resolution X-ray microscope providing an internal view of the structure of samples without cross-sectioning (X-ray microscopy + scanning electron microscopy = 3D tomographic imaging).
HORIBA.
Horiba is a manufacturer of optical spectroscopy instruments (fluorescence, Raman spectrometers and microscopes, NIR spectrometers, NDIR, FTIR gas analyzers, UV spectroscopic process gas analyzer, ambient ozone monitor, UV fluorescence sulfur in-oil analyzer), electrochemistry instruments, elemental analysis instruments (ICP-OES, glow discharge spectrometers, XRF spectrometers, EDXRF microspectrometer, XRF sulfur in-oil analyzers, C, H, N, O, S analyzers), environmental analysis instruments, emissions measurement instruments (air pollution analyzers, engine exhaust gas analyzers, stack gas analyzers, continuous emission monitoring systems, CEMS), water analysis instruments (handheld water quality meters, process water analyzers, water quality monitors), particle size, particle shape, zeta potential, and surface area analysis instruments (particle size, particle shape analyzers, surface area analyzers, zeta potential analyzers), thin film measurement instruments (ellipsometers). Horiba also manufactures gratings and OEM mini CCD spectrometers.
IXRF Systems, Inc.
IXRF Systems is a manufacturer of EDS microanalysis and imaging systems for electron microscopes, EDS detectors, EDS system upgrades, integrated X-ray fluorescence microanalysis systems for scanning electron microscopes (integrated XRF analysis in the SEM). IXRF Systems manufactires a complete EDS systems, EDX/EDS microanalysis systems, upgrades for existing EDS systems, EDS detector upgrades, such as light element windows, crystal changes. IXRF Systems manufactures X-ray fluorescence (XRF) microanalysis instruments for scanning electron microscopes: collimated X-ray source providing a 500 micron to 5mm X-ray spot analysis in the SEM, and micro-XRF analyzer system (X-ray spot sizes around 40-60 microns or larger). The key benefit is a reduced background - very low elemental analysis (ppm) can be performed. The X-ray fluorescence (XRF) microanalysis instruments uses SEM stages for creating elemental maps at the ppm level. The micro-EDXRF spectrometer system for scanning electron microscopes incorporates a polycapillary focusing optic to focus the x-ray beam, creating an excitation area of about 40 microns. The collimated X-ray source for SEM and micro-XRF spectrometer system can be adapted to just about any electron microscope and used with any EDS system.
JEOL Ltd.
JEOL Ltd is a manufacturer of transmission electron microscopes (TEM systems), scanning electron microscopes (SEM systems), electron probe micro analyzers (EPMA), Auger microprobe analyzers (AES), scanning probe microscopes (SPM systems), X-Ray  photoelectron spectrometers (XPS systems), nuclear magnetic resonance spectometers, electron spin resonance spectormeters, mass-spectrometers, MS/MS, GC/MS systems, LC/MS systems, X-ray fluorescence spectrometers, amino acid analyzers, clinical biochemistry analyzers, laboratory information systems. JEOL manufactures a broad range of electron microscopes and surface microanalysis instruments, including: transmission electron microscopes, scanning electron microscopes, analytical scanning electron microscopes (SEM + optional energy dispersive X-ray spectrometer, EDS for elemental analysis), scanning probe microscopes, field emission Auger microprobe analyzers, electron probe microanalyzers (EPMA, up to 5 energy dispersive X-ray spectrometers for elemental analysis), X-Ray photoelectron spectrometers. JEOL manufactures double-focusing magnetic sector mass spectrometers and MS-MS systems, dioxin analysis MS system, magnetic sector GC-MS system, quadrupole GC-MS system, TOF GC-MS system, and TOF API HPLC-MS system. JEOL manufactures high performance, research grady nuclear magnetic resonance spectometers, electron spin resonance spectormeters (high resolution NMR spectrometers, ESR spectrometers). JEOL manufactures X-ray fluorescence spectrometers (XRF spectrometer). JEOL also manufactures amino acid analyzers, clinical biochemistry analyzers.
Jordan Valley Semiconductors Ltd.
Jordan Valley Semiconductors is a manufacturer of automatic film thickness and composition measurement systems, multichannel thin-film materials research and quality control instruments. Jordan Valley Semiconductors provides metrology solutions for thin films based on rapid, non-contacting and non-destructive X-ray technology for the semiconductors industry. Jordan Valley Semiconductors manufactures a comprehensive suite of X-ray metrology tools for for the semiconductor and microelectronics industries. In April 2008, Jordan Valley Semiconductors extended its business with the acquisition of Bede, a supplier of high-resolution XRD metrology solutions for the semiconductor and compound industries. The company offers a complete family of automation metrology solutions based on high-speed, non-destructive XRR (X-ray reflectance), micro-XRF (micro-spot X-ray fluorescence), SAXS (small angle X-Ray scattering), HRXRD (high resolution X-ray diffraction) and WAXRD (wide angle X-ray diffraction) technologies. Jordan Valley Semiconductors manufactures flexible X-ray diffraction instruments for thin-film materials research, process development, and quality control. Jordan Valley Semiconductors manufactures high resolution X-ray diffractometer - high resolution X-ray diffraction tool for semiconductor development and quality control.
Kratos Analytical Limited.
Kratos Analytical Limited is a manufacturer of XPS instruments for surface analysis and mass-spectrometry instruments for life sciences (MALDI TOF MS systems for biochemical applications, proteomics, combinatorial chemistry). Kratos Analytical is a wholly owned subsidiary of the Shimadzu Corporation. Kratos Analytical manufactures a family of X-ray photoelectron spectrometers (XPS microanalysis systems) for surface analysis and imaging.
Nytek Instruments.
Nytek Instruments is a supplier of fluorescence spectrometers and microscopes, Raman spectrometers, Raman microscopy systems, thin film measurement instruments (ellipsometers), ICP-OES systems, glow discharge spectrometers, XRF spectrometers, EDXRF microspectrometer, XRF sulfur in-oil analyzer, UV fluorescence sulfur in-oil analyzer, C, H, N, O, S analyzers. Nytek Instruments supplies optical components and modules, instrument parts, accessories and consumables for chromatography and spectroscopy. The company also supplies pure gas generators, oilless compressors, pure air generators.
Oxford Instruments plc.
Oxford Instruments (UK) is a manufacturer of analytical instruments and scientific equipment. Oxford Instruments manufactures portable X-ray fluorescence instruments, handheld XRF metal analyzers, alloy testers (hand-held XRF analyzers for PMI, positive material identification, alloy analysis, alloy identification, RoHS, hazardous material analysis), laboratory XRF spectrometers (XRF sulfur in oil analyzer, sulphur in petroleum analyzers), coating thickness and material composition measuring instruments (coating gauges, XRF coating analyzers), optical emission metal analyzers, OES alloy testers (mobile OES metal analyzers, OES PMI systems,OES alloy sorters, laboratory high performance OES metal analyzers). Oxford Instruments manufactures X-ray microanalysis attachments, microspectrometer systems for scanning electron microscopes, SEM systems, transmission electron microscopes, TEM systems (EDS, energy dispersive microanalysis system, WDS, wavelength dispersive microanalysis system, EBSD, electron backscatter diffraction microanalysis system). Oxford Instruments manufactures X-ray tubes and components (low power X-ray tubes, small focal spot X-ray tubes, highly stable X-ray tubes, mono-blocks packaged X-ray tubes, microfocus X-ray source, portable X-ray sources).
Parallax Research, Inc.
Parallax Research is a manufacturer of X-ray microanalysis instruments (X-ray microspectrometers), X-ray optics and X-ray components for scanning electron microscopes, transmission electron microscopes, electron probe microanalyzers, Auger microanalyzers. Parallax Research manufactures wavelength dispersive microspectrometers (WDS), energy dispersive microspectrometers (EDS) and WDS + EDS microanalysis package for SEM and TEM systems, electron probe microanalyzers (EPMA), Auger microanalyzers. The company specializes in low energy (light elements) X-ray microanalysis. Parallax Research manufactures attachable low-energy X-ray optic for energy dispersive microspectrometers. Parallax Research also manufactures proportional counters for use in X-ray microanalysis instruments and XRF spectrometers, components for interfacing X-ray microanalysis instruments to SEM systems.
Rigaku Corporation.
Rigaku Corporation and its subsidiary companies manufactures X-ray spectrometers (WDXRF, EDXRF instruments), X-ray diffractometers (single crystal X-ray diffraction instruments, protein and small molecule XRD systems), small angle X-ray scattering (SAXS) instruments, thermal analysis instruments, and lab automation products (laboratory robotics). Rigaku manufactures bench top total reflection X-ray fluorescence (TXRF) spectrometer, performs elemental analysis down to PPB levels, energy dispersive X-ray fluorescence (EDXRF) elemental analyzers, in-line X-ray transmission sulfur analyzer (process, on-line XRT sulfur gauge for crude oil, marine bunker fuel and blending operations). Applied Rigaku Technologies, Inc. division in Austin, Texas USA is dedicated to designing, manufacturing and supporting EDXRF benchtop spectrometers - elemental analyzers as well as at-line, on-line, real-time process control elemental analysis instrumentation (provides both elemental analysis + thickness and composition measurement of multi-layer thin films). The company manufactures the semiconductor metrology instrumentation. Rigaku specializes in manufacturing XRF, XRD and XRR metrology tools to measure critical process parameters like thin film: thickness, composition, roughness, density, porosity, and crystal structure. Rigaku manufactures process TXRF and VPD-TXRF tools for contamination measurement, including in-line X-ray metal film monitor designed for high-throughput, product-wafer measurements. Rigaku manufactures X-ray optics, X-ray generators and detectors for scientific instruments, including microfocus rotating anode X-ray generator, X-ray sources for macro-molecular crystallography, low-noise CCD imaging detectors. Rigaku Corporation also manufactures X-ray stress analyzer for materials science.
Rigaku Corporation manufactures a complete range of protein crystallography instruments, small molecule crystallography instruments, including modular and expandable protein crystal imaging and analysis system. Rigaku Corporation manufactures a complete suite of laboratory automation products for protein crystallography, including protein crystal growth integrated storage, retrieval, and imaging systems and crystal scoring software.
Roenalytic GmbH (formerly Roentgenanalytik Messtechnik GmbH).
Roenalytic GmbH (Germany, until October 2008 known as Roentgenanalytik Messtechnik GmbH) is a manufacturer of X-ray fluorescence analyzers (X-ray fluorescence instrument company). Roenalytic GmbH manufactures X-ray fluorescence spectrometers for coating thickness and composition measurement, microanalysis, determination of precious metals, fast, non-destructive and accurate Karat-measurement of precious metals and finished jewellery. Roenalytic GmbH manufactures XRF precious metals analyzer - X-ray fluorescence spectrometer for fast, non-destructive and accurate Karat-measurement of precious metals and finished jewellery (noble metals analyzer, XRF gold analyzer features sample positioning by a video system and a sample stage). The company manufactures a family of micro-XRF analyzers for small parts and inclusions spot analysis, materials and coatings elemental mapping, ROHS/WEEE measurements (micro X-ray fluorescence spectrometers with beam concentration by capillary optics, possible spot sizes range from 20 µm to 300 µm). Roenalytic GmbH manufactures XRF sediment core analyzer - a micro beam X-Ray fluorescence spectrometer designed specifically for the measurement of the elemental distribution of layered sediment cores.
Scientific Instruments (Научные Приборы).
Scientific Instruments (Saint Petersburg, Russia) is a manufacturer of  X-ray fluorescence spectrometers (laboratory XRF analyzer, portable XRF analyzer), XRF microspectrometer, XRD instruments (X-ray diffractometers, X-ray microdiffractometer), laser particle size analyzer.
Shimadzu Corporation.
Shimadzu Corporation is one of the world's leading analytical instrument and scientific instrument companies, a manufacturer of analytical equipment (gas chromatography, liquid chromatography instruments and systems, portable ion chromatography systems, mass spectrometry, optical spectroscopy, X-Ray spectroscopy instruments and systems, elemental analyzers, thermal analyzers), laboratory equipment (electronic laboratory balances, analytical balances, moisture determination balances - balance moisture analyzers), measuring equipment (calorimeters, moisture meters, viscometers, rheometers, particle size analyzers, force gauges, specific gravity meters), scientific equipment (XRF spectrometers, X-ray diffractometers, surface analysis instruments: scanning electron microscopes, scanning probe microscopes), materials testing equipment (material testing machines, hardness tester systems).
Shimadzu Corporation manufactures a broad range of elemental analysis and spectroscopy equipment, instruments, systems: TC, TN, TIC, TOC analyzers (total carbon analysers, total nitrogen analyzers, total inorganic carbon analysers, total organic carbon analyzers), atomic-absorption spectrometers (flame and graphite furnace AAS instruments), spark optical emission spectrometers for metal analysis and alloy identification (OES metal analyzers), ICP spectrometers, FT-IR spectrometers and FTIR microscopes (FT-IR microanalysis systems), UV-visible spectrophotometers, fluorescence spectrometers, MALDI-TOF mass spectrometry systems, X-ray fluorescence spectroscopy and X-ray diffractometry instruments (X-ray fluorescence spectrometers and X-ray diffractometers), optical components (holographic gratings), consumable products, parts and accessories for spectroscopy and elemental analysis.
Shimadzu Corporation manufactures scanning electron microscopes (SEM systems), analytical scanning electron microscopes (SEM-EDX combined microanalysis system), scanning probe electron microscopes (SPM systems), electron probe microanalyzer (EPMA), and energy dispersive micro X-ray fluorescence spectrometer (micro-EDXRF spectrometer system).
SPECS Surface Nano Analysis GmbH.
SPECS Surface Nano Analysis GmbH (Berlin, Germany) is a manufacturer of specialized spectrometer systems for surface microanalysis and imaging (surface spectroscopy and microscopy systems). SPECS Surface Nano Analysis manufactures electron spectrometers, fully automated ESCA system, secondary ion mass spectrometry + secondary neutral mass spectrometry system (SIMS + SNMS system), X-ray  photoelectron spectrometer (ultra high resolution XPS analyzer), Auger spectrometer (AES system), electron energy loss spectrometer (EELS system), low energy electron microscopy + photoelectron emission microscopy system (LEEM + PEEM system), low energy electron diffraction analyzer (LEED surface analyzer), photoemission spectrometer, time-of-flight spectrometer, scanning tunneling spectroscopy and microscopy system (STM system). SPECS GmbH manufactures a line of high resolution hemispherical energy analyzers for electron and ion spectroscopy, non-contact atomic force microscopy instrumentation (NC-AFM system), the Joule-Thomson scanning tunneling microscope. SPECS GmbH offers customized systems combining thin film preparation (MBE) with spectroscopic and microscopic options. The company also manufactures a variety of sources for deposition, excitation and charge neutralization as well as analyzers, monochromators, detectors.
Author of the catalogue - Andrey Yurievich Zhdanov. Автор каталога - Андрей Юрьевич Жданов.
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Статистика LiveInternet (multilanguage statistics). Статистика счетчика Rambler's  Top 100.       .
Analytical and laboratory equipment companies, scientific instrument companies. Производители и поставщики аналитического и лабораторного оборудования.
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