|Manufacturers and suppliers of surface analysis equipment, surface analysis instrumentation, surface microanalysis, microspectroscopy instrumentation (FTIR microscopes, Raman microscope and imaging systems, fluorescence analytical microscopes, fluorescence microspectrometers, X-ray fluorescence microspectrometers, XRF microscopes, scanning electron microscopes, scanning probe microscopes, atomic force microscopes, transmission electron microscopes, electron probe microanalyzers, electron backscatter diffraction, EBSD, EDS microanalysis and imaging instruments for analytical SEM, TEM systems, EELS, electron energy loss spectrometers, Auger spectrometers, XPS, X-ray photoelectron spectrometers, secondary ion mass spectrometers, SIMS microprobe analyzers, microhardness testers, nanoindentors).||Производители и поставщики оборудования, приборов для анализа состава и микроструктуры поверхности образца (аналитические ИК-Фурье микроскопы, Рамановские микроскопы, флуоресцентные микроскопы, рентгенофлуоресцентные аналитические микроскопы, растровые, сканирующие, электронные микроскопы, сканирующие зондовые микроскопы, атомно-силовые микроскопы, микрозонды, просвечивающие электронные микроскопы, приборы для анализа дифракции отражённых электронов, элементного картирования, Оже спектрометры, рентгеновские фотоэлектронные спектрометры, масс-спектрометры вторичных ионов для точечного анализа поверхности материалов, микротвердомеры, наноинденторы).|
|Manufacturers and suppliers of secondary ion mass spectrometers for surface analysis (secondary ion mass-spectrometry instrumentation, surface analysis mass spectrometry instrumentation, SIMS systems for surface analysis).||Производители и поставщики масс-спектрометров вторичных ионов для анализа химического состава поверхности материалов (масс-спектрометрического анализа поверхности материалов).|
|International companies index.||Международный указатель компаний.|
|Australian Scientific Instruments Pty Ltd.|
|Australian Scientific Instruments (ASI) is a manufacturer of mass spectrometry instruments for geochemistry (high resolution secondary ion mass spectrometer for elemental analysis, stable isotope analysis of solid samples, automated MS system for uranium-helium thermochronology studies), and mechanical testing equipment for geophysics and geomechanics (high temperature, high pressure test machine for rock deformation studies). Australian Scientific Instruments manufactures high performance, high resolution SIMS instrument for geology, geochemistry, mineralogy - double-focussing secondary ion mass spectrometer for elemental analysis, isotopic analysis of geological samples, solid targets (high resolution secondary ion mass-spectrometer for microanalysis of geological samples, high resolution ion microprobe). Australian Scientific Instruments manufactures automated uranium-helium thermochronology instrument - turnkey mass-spectrometry system designed for the extraction and measurement of gases from mineral samples. Australian Scientific Instruments manufactures a high pressure, high temperature apparatus for mechanical testing of rock samples at confining pressures up to 500 MPa, and temperatures up to 1600 K (a high temperature, high pressure rock testing machine - equipment for rock deformation studies under conditions of extreme pressure and temperature).|
|CAMECA (France) is a manufacturer of surface microanalysis and elemental mapping instruments for research, materials science, geology, geosciences, semiconductors, and metrology equipment for semiconductor industry. CAMECA is a business unit of the AMETEK Materials Analysis Division. CAMECA manufactures low energy X-ray emission spectrometry systems, SIMS microprobe analyzers, secondary ion mass spectrometry systems for semiconductors materials science and geosciences, EPMA, electron probe microanalysis systems for materials science and geosciences, laser assisted tomographic atom probe microanalysis and imaging systems for materials and semiconductors. The CAMECA instruments provide elemental and isotopic composition data from micron down to sub-nanometer scale. The company manufactures a broad range of secondary ion mass spectrometers for surface microanalysis: universal magnetic sector SIMS system for materials and semiconductors, magnetic sector SIMS system for advanced semiconductors, magnetic sector SIMS system for geoscience laboratories, ultra high sensitivity magnetic sector SIMS system for geoscience labs, high performance SIMS system for isotopic and trace element analysis at high spatial resolution, universal quadrupole SIMS system for semiconductors and materials, shielded magnetic sector SIMS system for radioactive samples (on request). CAMECA manufactures laser assisted tomographic atom probe microanalysis and imaging system providing quantitative atomic scale 3D elemental mapping of chemical heterogeneities in materials. Laser assisted tomographic atom probe microanalysis and imaging system features atomic scale depth resolution in semiconductors, excellent mass resolution even on low thermal conductivity materials, large area of analysis (up to 100 nm in diameter) for a better statistics on composition measurements, flexible and fast dedicated FIM (field ion microscopy) detector for metallurgical applications. CAMECA manufactures electron probe microanalysis system (EPMA system) for materials science and geosciences. Electron probe microanalysis system featured fully integrated optical microscope, up to 5 wavelength dispersive spectrometers (WDXRF spectrometers), + energy dispersive spectrometer (EDXRF spectrometer), high voltage electron gun operates at up to 40 kV for elements with high atomic number, trace element measurements and high speed X-ray mapping. Also manufactures shielded electron probe microanalysis system for radioactive samples. Electron probe microanalyzer system are equipped with a complete kit of built-in microscopy tools that allow simultaneous X-ray (WDXRF and EDXRF), SEM and BSE imaging. CAMECA manufatures process control systems for the semiconductor manufacturing industry (metrology tools): in-line low energy X-ray emission spectrometer system, near-line full wafer magnetic sector SIMS analyzer, automated, full wafer quadrupole SIMS analyzer.|
|Hiden Analytical Ltd.|
|Hiden Analytical Ltd is a manufacturer
of quadrupole mass spectrometers for gas analysis and secondary ion mass
spectrometers (SIMS) for surface analysis, sorption characterisation instrumentation
(gravimetric analysers) and multistream valves. Hiden Analytical Ltd is
a manufacturer of DSMS series gas analyzers (dynamic sampling mass spectrometers)
for high precision gas purity analysis, residual gas analysis, quantitative
gas analysis for gas reaction studies, on-line process control and gas
composition measurements. Hiden Analytical Ltd is a manufacturer of SIMS
systems (secondary ion mass spectrometers) for surface & interface
analysis, fundamental surface studies and routine industrial sample analysis.
Hiden Analytical Ltd is a manufacturer of sorption characterisation instrumentation
measuring gas and vapour sorption and moisture sorption, sorbent characterisation.
Hiden Analytical manufactures intelligent gravimetric analysers for gas
& vapour sorption characterisation.
The Hiden Analytical’s HPR-20 dynamic sampling mass spectrometry system is a bench mounted, cart mounted or console configured system for continuous analysis of gases at pressures upto atmosphere. Features high sensitivity and stability together with wide dynamic range.
The Hiden Analytical’s EQS secondary ion mass spectrometer for static and dynamic SIMS applications features combined sector field analyser and triple filter quadrupole mass spectrometer. Ionised species with masses up to 1000 amu may be analysed. An integral electron impact ion source is utilised for conventional RGA, leak detection and Secondary Neutral Mass Spectrometry (SNMS). The EQS employs a high performance triple quadrupole filter and sector field analyser with DC quadrupole input focusing lens. Ions passing through the instrument have simple curved trajectories with virtually 100% transmission within the pass band.
The Hiden Analytical’s SIM Probe is a compact bolt-on probe combining an in-line energy analyser with a quadrupole mass spectrometer for surface mapping, depth profiling and interface analysis. Features in-line Bessel Box energy analyser and triple filter quadrupole mass spectrometer. A built-in ion source permits the analysis of sputtered neutrals as well as standard RGA for vacuum chamber diagnostics. In Multiple Ion Detection (MID) mode, positive and negative ions of different mass and energy can be selectively and simultaneously monitored. This allows the user to optimise the SIMS analysis for each ion of interest and to do trend analysis of the selected ions for depth profiling applications.
The Hiden Analytical’s Moisture Sorption Analyser IGAsorp is designed to accurately measure the magnitude and kinetics of moisture sorption onto materials. It is fully automated and combines an ultra sensitive microbalance with precise measurement and control of both humidity and temperature. The IGA series of instruments uniquely utilise the IGA method to intelligently determine equilibrium uptakes and kinetics. It is a bench top system specially developed for the pharmaceutical, food and packaging industries. Suited to QA testing and product R&D. Optional Upgrade to run with Organic Vapours.
|Ionwerks, Inc is a mass-spectrometry instrument company,
manufacturer of time-of-flight (TOF) surface analysis instrumentation,
gas analysis and plasma analysis instrumentation, MALDI TOF mass-spectrometer
and electronics for TOF mass spectrometers. Ionwerks Inc manufactures a
complete line of instrumentation and electronic equipment for use in time-of-flight
mass spectrometry includes: the CompactTOF mass spectrometer for gas analysis
and plasma analysis, mass spectrometer for surface analysis combined the
mass spectrometry of recoiled ions (MSRI), direct recoil spectrometry (DRS)
and secondary ion mass spectrometry (SIMS) in one compact analytical instrument,
neutral atom beam source (NABS), position sensitive detector (PSD), 4-anode
detector and one anode detectors, beam buncher, Poschenrieder TOF/Electrostatic
energy analyzer, time-to-digital converter (TDC) and software to use it,
TOF timing controller, high voltage pulser, power supply for beam steering,
capacitive decoupler for detectors and detector power supply.
The CompactTOF is the orthogonal extraction reflector time-of-flight mass spectrometer (ORTOF) for gas and plasma analysis, features compact and inexpensive design. Ionwerks Inc manufactures PlasmaTOF for plasma and gas analysis, GasTOF RGA with EI source, Mobility-TOF with MALDI source. Ionwerks Inc also offers the electronics to run this instrument - voltage supplies, a high voltage pulser, PC card timing controller, and time-to-digital converter (TDC) for data acquisition. Other products include a complete alkali ion beam line based on surface ionization sources, and a new 4-channel time-to-digital converter which makes it possible to use DRS and MSRI to monitor surface structure and composition during thin film growth. The instruments provide the in-situ structural and elemental analysis necessary for the growth of superior wide-bandgap materials, including diamond, gallium nitride, and silicon carbide.
|Kore Technology Limited.|
|Kore Technology Limited is a manufacturer of scientific
and analytical instruments for time-of-flight mass spectrometry: field
portable TOF-MS for air and gas analysis, TOF-SIMS for surface chemical
analysis, BIOTOF-SIMS chemical imaging time-of-flight mass spectrometer
for life sciences, TOF mass spectrometry components and electronics (reflectrons,
time-of-flight spectrometer power supplies and timing electronics - time
to digital converter). Kore Technology Limited manufactures a various modules
to assist in building time-of-flight data acquisition systems. Kore Technology
Limited specialises in the development and supply of innovative time-of-flight
mass analysers to detect and measure ultra-low level contaminants and time-of-flight
instrument upgrades (service and upgrade old Kratos TOF-SIMS and VG TOF-SIMS).
Kore Technology Limited is a manufacturer of sample handling equipment
and stages (the rotating stage and other sample handling products). Kore
Technology Limited also manufactures Cassegrain lens (this all-metal reflecting
optics lens was originally designed as a long working distance, in-vacuum,
on-axis lens yielding sub-micron diameter spot sizes for laser microprobe
Featured products: The MS-200 Portable Mass Spectrometer is a field portable, battery powered TOF mass spectrometer for gas analysis entirely contained in a single case. MS-200's membrane inlet concentrator allows a wide range of gases to be identified and measured from the low p.p.b. range up to percent levels. Automatic mixture analysis software in the MS-200 eliminates the need of a GC interface. The MS-200 uses electron impact ionisation, yielding spectra that correspond to extensive and well established mass spectral databases.
The MS-1000 Compact Secondary Ion Time-Of-Flight Mass Spectrometer for Surface Analysis is a bench-top scale analyser that identifies the chemistry and molecular structure of the surface of solid samples. MS-1000 is a time-of-flight Secondary Ion Mass Spectrometer (TOF-SIMS) and operates in the static mode of SIMS; meaning that it is highly sensitive and analyses only the top most layer of molecules on the sample. The MS-1000 easy to use and has a fast sample turnaround time of 15 minutes. MS-1000 is designed for product quality control and fault diagnosis at or close to the point of manufacture, to use is areas where other surface analysers have proved uneconomical or technically unfeasible.
The MS-2000 BIOTOF-SIMS - An affordable research grade chemical imaging time-of-flight mass spectrometer. MS-2000s are being used to study bio-systems that require high spatial resolution surface analysis, such as self-assembly monolayer systems, locating molecules in cell surfaces and spatially sequencing proteins particularly to build up combinatorial libraries.
Kore Technology Limited is a supplier of Galileo electron multiplier detectors. A wide range of detector options based on both microchannel plates, and on channeltrons. Kore Technology Limited represents Galileo in Europe for both detector types (Galileo Corporation's Scientific Detector and Spectroscopy Products Business acquired by Burle Industries Inc, the successor company to the RCA New Products Division located in Lancaster, PA USA, a major U.S manufacturer of vacuum tube products, including photomultiplier tubes, power tubes, and imaging tubes).
Kore Technology Limited is a licensed reseller of the widely used and highly respected NIST mass spectral library of electron impact (EI) ionisation spectra.
|Physical Electronics Inc.|
|Physical Electronics USA, a subsidiary of ULVAC-PHI, is
a manufacturer and supplier of surface analysis instrumentation for research
and industrial applications. Physical Electronics Inc provides a complete
line of scientific and analytical instruments for surface analysis including:
AES, ESCA, TOF-SIMS and D-SIMS based instrumentation. Physical Electronics
is a developer, manufacturer and supplier of surface analysis instrumentation
which utilizes the Auger, ESCA/XPS, Dynamic SIMS and TOF-SIMS techniques.
Physical Electronics manufactures:
Auger Instruments - Auger microprobe provides characterization of complex structures. Smart Tool - An in-FAB defect review tool providing compositional microanalysis for particles down to 50 nm or less, that can accommodate 200-mm and 300-mm wafers.
ESCA Instruments - Quantera SXM. The Quantera Scanning x-ray Microprobe provides unique micro area XPS capabilities and industry-leading depth profiling capabilities in a completely automated and easy to use instrument package. The PHI 1800 provides a high performance MultiTechnique XPS platform that can be configured to meet a wide variety of research oriented needs.
D-SIMS Instruments - ADEPT-1010. A high-performance SIMS depth-profiling tool designed to meet the analytical requirements of 0.18 um linewidth semiconductor implant technology.
TOF-SIMS Instruments - TRIFT III for sub-micron elemental, chemical and molecular characterization of solid surfaces and thin films. The TRIFT III offers detection limits in the ppm to ppb range, shallow depth profiling capabilities and automated analysis.
|Scientific Analysis Instruments Ltd. (SAI)|
|Scientific Analysis Instruments Limited (SAI) is a manufacturer
and supplier of mass spectrometry instruments and software. Scientific
Analysis Instruments is a manufacturer of MALDI-ToF mass spectrometers
and ToF based GC-MS system. Scientific Analysis Instruments Limited (SAI)
is part of a group of companies providing products and services to the
chemical and environmental industry - Scientific Analysis Laboratories
Ltd (SAL). The company owns one of the largest groups of contract environmental
laboratories in the UK with facilities in Manchester, Glasgow, Essex,Cambridge
and Reading. The group also includes an environmental consultancy company.
Scientific Analysis Instruments Limited (SAI) founded in 1995, is staffed
by experienced scientists and engineers who have specialist knowledge in
the design and construction of mass spectrometers.
Scientific Analysis Instruments Limited (SAI) manufactures Matrix Assisted Laser Desorption Ionisation Time of Flight Mass Spectrometers (MALDI-ToF-MS). Products include a range of MALDI-ToF (High power ToF-ToF and Benchtop ToF-MS) and GC/ToF-MS instruments as well as delayed extraction upgrade kits and other mass spectrometry consultancy projects.
|SPECS Surface Nano Analysis GmbH.|
|SPECS Surface Nano Analysis GmbH (Berlin, Germany) is a manufacturer of specialized spectrometer systems for surface microanalysis and imaging (surface spectroscopy and microscopy systems). SPECS Surface Nano Analysis manufactures electron spectrometers, fully automated ESCA system, secondary ion mass spectrometry + secondary neutral mass spectrometry system (SIMS + SNMS system), X-ray photoelectron spectrometer (ultra high resolution XPS analyzer), Auger spectrometer (AES system), electron energy loss spectrometer (EELS system), low energy electron microscopy + photoelectron emission microscopy system (LEEM + PEEM system), low energy electron diffraction analyzer (LEED surface analyzer), photoemission spectrometer, time-of-flight spectrometer, scanning tunneling spectroscopy and microscopy system (STM system). SPECS GmbH manufactures a line of high resolution hemispherical energy analyzers for electron and ion spectroscopy, non-contact atomic force microscopy instrumentation (NC-AFM system), the Joule-Thomson scanning tunneling microscope. SPECS GmbH offers customized systems combining thin film preparation (MBE) with spectroscopic and microscopic options. The company also manufactures a variety of sources for deposition, excitation and charge neutralization as well as analyzers, monochromators, detectors.|
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|Catalogue area - analytical equipment, laboratory equipment, FTIR, NIR spectrometers, Raman spectrometers, FTIR, NIR, Raman portable analyzers and process analyzers, FTIR microscopes, Raman microscopes, FT-IR, Raman imaging systems, fluorometers, fluorescence spectrometers, UV-visible, NIR spectrophotometers, refractometers, polarimeters, saccharimeters, lab, portable Brix meters, process in-line Brix monitors, atomic-absorption spectrometers, optical emission spectrometers for metal analysis, arc, sparc OES metal analyzers, alloy sorters, inductively coupled plasma atomic-emission spectrometers, ICP-AES (ICP-OES) systems, inductively coupled plasma mass-spectrometers, ICP-MS systems, NMR spectrometers, EPR spectrometers, X-ray fluorescence spectrometers, XRF spectrometers for metal analysis, lab, portable XRF metal analyzers, XRF sulfur in oil analyzers, mass-spectrometry instruments, TOF, quadrupole, magnetic sector mass-spectrometers, MS-MS systems, GC/MS instruments, GC-MS-MS systems, LC/MS systems, LC-MS-MS systems, GC instruments, lab, portable gas chromatographs, online, process GC systems, HPLC instruments, capillary LC systems, preparative LC systems, TLC equipment, ion chromatography instruments, ion chromatographs, ion analyzers, electrophoresis instruments, capillary electrophoresis systems, electrochemical analyzers, portable, process electrochemical instruments, flow injection analyzers, FIA systems, segmented flow analyzers, food analysis instruments, food testing equipment, NIR, FT-IR food and grain analyzers, food microbiology equipment, water analysis instruments, portable water testers, online water quality monitors, TOC analyzers, pharmaceutical analysis instruments, dissolution testing systems, tablet testers, FTIR, NIR tablet analyzers, petroleum testing instruments, flash point testers, NIR, FTIR gasoline analyzers, diesel fuel analyzers, C, H, N, O, S analyzers, GC, MS, FTIR gas analyzers, emissions analyzers, CEMS, thermal analysis instruments, TGA, DTA, STA systems, calorimeters, DSC systems, dilatometers, high temperature dilatometers, rheometers, viscometers, plastometers, melt flow indexers, materials testing equipment, material testing machines, environmental, climatic test chambers, particle size, particle shape analyzers, pore volume, surface area analyzers, tensiometers, X-ray diffraction instruments, XRD systems, scanning electron microscopes, SEM systems, transmission electron microscopes, TEM systems, scanning probe microscopes, atomic force microscopes, lab equipment for microbiology, biotechnology, pharmacology, biological safety cabinets, microbial analyzers, сolony counters, flow cytometers, osmometers...|
|Author of the catalogue - Andrey Yurievich Zhdanov.||Автор каталога - Андрей Юрьевич Жданов.|
|Analytical and laboratory equipment companies, scientific instrument companies.||Производители и поставщики аналитического и лабораторного оборудования.|