Аналитические приборы и лабораторное оборудование, газовые хроматографы, хромато-масс-спектрометры, газохроматографические анализаторы, приборы для ВЭЖХ, высокоэффективные жидкостные хроматографы, препаративные жидкостные хроматографы, ИК-Фурье спектрометры, Рамановские спектрометры, БИК спектрометры, промышленные БИК анализаторы пищевых продуктов, УФ спектрофотометры, флуориметры, спектрофлуориметры, атомно-абсорбционные спектрофотометры, элементные анализаторы, рентгенофлуоресцентные спектрометры для анализа металла, оптико-эмиссионные анализаторы элементного состава металлов, сплавов, спектрометры ИСП, масс-спектрометры, газоаналитические приборы, масс-спектрометрические газоанализаторы.
Manufacturers and suppliers of surface analysis equipment, surface analysis instrumentation, surface microanalysis, microspectroscopy instrumentation (FTIR microscopes, Raman microscope and imaging systems, fluorescence analytical microscopes, fluorescence microspectrometers, X-ray fluorescence microspectrometers, XRF microscopes, scanning electron microscopes, scanning probe microscopes, atomic force microscopes, transmission electron microscopes, electron probe microanalyzers, electron backscatter diffraction, EBSD, EDS microanalysis and imaging instruments for analytical SEM, TEM systems, EELS, electron energy loss spectrometers, Auger spectrometers, XPS, X-ray photoelectron spectrometers, secondary ion mass spectrometers, SIMS microprobe analyzers, microhardness testers, nanoindentors). Производители и поставщики оборудования, приборов для анализа   состава и микроструктуры поверхности образца (аналитические ИК-Фурье микроскопы, Рамановские микроскопы, флуоресцентные микроскопы, рентгенофлуоресцентные аналитические микроскопы, растровые, сканирующие, электронные микроскопы, сканирующие зондовые микроскопы, атомно-силовые микроскопы, микрозонды, просвечивающие электронные микроскопы, приборы для анализа дифракции отражённых электронов, элементного картирования, Оже спектрометры, рентгеновские фотоэлектронные спектрометры, масс-спектрометры вторичных ионов для точечного анализа поверхности материалов, микротвердомеры, наноинденторы).
Manufacturers and suppliers of surface analysis equipment, instruments, systems (materials surface analysis and microanalysis instrumentation). Производители и поставщики оборудования, приборов, систем для химического анализа и микроанализа поверхности материалов.
International companies index. Международный указатель компаний.
Agilent Technologies.
Agilent Technologies is a manufacturer of GC, GC-MS systems, HPLC, SFC, GPC/SEC systems, LC-MS systems, capillary electrophoresis systems, FTIR spectrometers, FTIR microscopes, UV-visible-NIR spectrometers, fluorescence spectrometers, NMR spectometers, AAS instruments, ICP-AES, ICP-MS systems, X-ray crystallography systems, pharmaceutical testing equipment (dissolution apparatus, tablet testers), PCR instruments, lab automation solutions, lab robotics, laboratory software suite. Agilent Technologies is a manufacturer of mass-spectrometer helium leak detectors, vacuum pumps (rotary vane, dry scroll, diffusion pumps, turbomolecular pumps, ion pumps), high vacuum pumping systems, vacuum gauges, valves, flanges, fittings.
Agilent Technologies manufactures atomic absorption spectrometers (flame AAS instruments, GF AAS instruments), inductively coupled plasma atomic emission spectrometers (ICP-OES systems), inductively coupled plasma mass-spectrometers (ICP-MS systems). Agilent Technologies manufactures FTIR spectrometers, FTIR microscope systems (FTIR spectrochemical imaging systems), FT-IR dedicated oil analyzer, fluorescence spectrometers, UV-Visible spectrophometers. Agilent Technologies manufactures research grady nuclear magnetic resonance spectrometers (high resolution NMR spectrometers). Agilent Technologies manufactures X-ray crystallography instruments (XRD, X-ray diffractometer system).
Analytical Spectral Devices, Inc.
Analytical Spectral Devices, Inc. (ASD) is a manufacturer field portable and laboratory UV-visible-NIR spectrometers, spectroradiometers (remote sensing spectrometers), portable NIR analyzers, Vis-NIR analyzers. Analytical Spectral Devices manufactures lab and portable spectrometers covering the ultraviolet, visible and near infrared (NIR) wavelength ranges. Analytical Spectral Devices manufactures benchtop visible-NIR spectrometer systems and portable visible-NIR analyzers equipped with fiber optic probe. Analytical Spectral Devices manufactures rugged portable and mobile Vis-NIR analyzer systems for quality control of foods and pharmaceuticals - portable counterfeit drug detection systems, drug verification system, meat quality analyzer (beef tenderness analyser). Analytical Spectral Devices manufactures portable, rugged Vis-NIR analyzer equipped with the plant probe and leaf clip assembly for rapid in-field analysis of both living foliage and dried plant materials for the determination of nitrogen, lignin, cellulose and soluble sugars in plant tissue.
Australian Scientific Instruments Pty Ltd.
Australian Scientific Instruments (ASI) is a manufacturer of mass spectrometry instruments for geochemistry (high resolution secondary ion mass spectrometer for elemental analysis, stable isotope analysis of solid samples, automated MS system for uranium-helium thermochronology studies), and mechanical testing equipment for geophysics and geomechanics (high temperature, high pressure test machine for rock deformation studies). Australian Scientific Instruments manufactures high performance, high resolution SIMS instrument for geology, geochemistry, mineralogy - double-focussing secondary ion mass spectrometer for elemental analysis, isotopic analysis of geological samples, solid targets (high resolution secondary ion mass-spectrometer for microanalysis of geological samples, high resolution ion microprobe). Australian Scientific Instruments manufactures automated uranium-helium thermochronology instrument - turnkey mass-spectrometry system designed for the extraction and measurement of gases from mineral samples. Australian Scientific Instruments manufactures a high pressure, high temperature apparatus for mechanical testing of rock samples at confining pressures up to 500 MPa, and temperatures up to 1600 K (a high temperature, high pressure rock testing machine - equipment for rock deformation studies under conditions of extreme pressure and temperature).
Brimrose Corporation of America.
Brimrose Corporation is the analytical instrument company, manufacturer of the AOTF-NIR spectrometers for real-time, on-line industrial process control, raw materials identification, quality control in chemical, petrochemical, food, dairy, cosmetic, pharmaceutical operations (portable, laboratory, process NIR analyzers). Brimrose Corporation is a US manufacturer of and laser diode modules for OEM users. Brimrose Corporation manufactures near-infrared and mid-infrared spectrometers for at-line and batch process monitoring, features small size, high speed and robust construction. The Brimrose AOTF-NIR spectrometers have a compact, rugged, industrial hardened design without any moving parts to be suitable for industrial applications. The Acoustic Optic Tunable Filter Near Infrared (AOTF-NIR) technology enables the Brimrose spectrometer to scan very fast and without using moving parts. The AOTF-NIR spectrometer collects spectral data up to 16,000 wavelengths per second. The Brimrose 16 channel multiplexer provides cost-effective measurement of multiple streams in a production process. Analyzers can be placed at numerous points in the process and calibrations can be transferred from the laboratory to the industrial process. Brimrose Corporation manufactures miniature "Hand-held" NIR analyzer, miniature laboratory NIR analyzer, bench top laboratory NIR analyser, process NIR analyzer, process NIR analyzer with built-in multiplexer, miniature Free Space process NIR analyzer, ThinFilm NIR analyzer, dual purpose NIR analyzer, gasoline blend control NIR analyzer, "Seed Meister" NIR analyzer, Tablet NIR Analyzer.
Miniature "Hand-held" NIR Analyzer is a solid-state AOTF-NIR spectrometer system designed for the field portable non-destructive, contact, non-contact measurements of chemical and physical properties of powders, solids, liquids, gels in diffuse reflectance mode. Additional probe attachments allow use same analyzer for liquid transmission measurements. Battery operation optional. Miniature solid-state AOTF-NIR laboratory analyzers are designed for measuring the chemical and physical properties of liquids, solids, powders, gels in labs and warehouses, field by using variety of probes, flow cells, sample attachments.
The ThinFilm analyzers are designed for measuring on line chemical and physical properties on a wide range of substrates and coatings. Provides measurement of chemical composition, coating weight and thickness, non-contact analysis, real time at-line, in-line, on-line monitoring and control. Applications include thickness of organic lacquer or lubricant on metallic foils, tin-plate, sheet steel, metalized polymers and similar products. Coating weight of adhesive and residual solvent are also routinely measured. The analyzer can either be mounted on a traveler and scan across the web or measure statically.
The Free Space AOTF NIR diffuse reflectance analysers provides high performance measurements by direct placement in sample lines for applications such as: inspection of tablets and vials, seeds and feed measurements on pipes, in-situ measurement of pellets, films and coatings, cotton/polyester ratio directly in the web, moisture monitoring, thickness and coating measurements directly in the webs for the need to measure chemical composition, physical parameters and additives in their many polymer products.
Bruker Corporation.
Bruker is a manufacturer of quadrupole, ITD, TOF mass-spectrometers, GC/MS, MS/MS, LC/MS/MS systems, FTIR, FT-NIR, Raman spectrometers, NMR, EPR spectrometers, NMR analyzers, X-ray fluorescence spectrometers, portable XRF analyzers, X-ray diffractometers, single crystal diffraction instruments (XRD, SCD systems), spark-OES metal analyzers, combustion elemental analyzers, portable ion mobility spectrometers, portable FTIR analyzers, biological, chemical and nuclear detection instruments. Bruker Scientific Instruments Division (Bruker AXS, Bruker BioSpin, Bruker Daltonics, Bruker Optics) offers a broad range of instruments and solutions for analytical chemistry, life sciences, clinical research, materials research, environmental analysis, forensics, lab automation, process control, quality control.
Bruker AXS manufactures a broad range of X-ray fluorescence spectrometers for quantitative elemental analysis, portable XRF spectrometers (handheld XRF analyzers), X-ray fluorescence microanalysis instruments (micro-XRF spectrometers, X-ray microanalysis systems), X-ray diffraction instruments, single crystal diffraction systems (SCD systems), and X-ray components (X-ray sources, detectors, X-ray optics). Bruker AXS also manufactures sparc optical emission spectrometers for metal analysis (spark OES metal analyzers) and combustion analyzers for metals. Bruker AXS manufactures atomic force microscopes / scanning probe microscopes (AFM/SPM systems). Bruker AXS offers radionuclide spectrometers.
Bruker Optics manufactures research FT-IR spectrometers, FT-NIR spectometers, Raman spectrometers, FT-Raman and FT-IR microscopes, process FT-NIR analyzers, time domain low resolution NMR spectrometers (low resolution benchtop NMR analyzers for QC/QA), terahertz spectrometers, imaging spectrograph and scanning monochromator. Bruker Optics manufactures specialized FT-NIR spectrometers for a wide range of NIR applications in QA/QC and process control, FT-NIR spectrometer for in-line process control with non-contact analysis capabilities. Bruker Optics offers high resolution FT-Raman spectrometers for both research and process control solutions, process Raman systems, FT-Raman microscopes for non-destructive analysis of microscopic samples. Bruker Optics manufactures automated infrared detection system for real-time remote sensing of atmospheric compounds.
CAMECA.
CAMECA (France) is a manufacturer of surface microanalysis and elemental mapping instruments for research, materials science, geology, geosciences, semiconductors, and metrology equipment for semiconductor industry. CAMECA is a business unit of the AMETEK Materials Analysis Division. CAMECA manufactures low energy X-ray emission spectrometry systems, SIMS microprobe analyzers, secondary ion mass spectrometry systems for semiconductors materials science and geosciences, EPMA, electron probe microanalysis systems for materials science and geosciences, laser assisted tomographic atom probe microanalysis and imaging systems for materials and semiconductors. The CAMECA instruments provide elemental and isotopic composition data from micron down to sub-nanometer scale. The company manufactures a broad range of secondary ion mass spectrometers for surface microanalysis: universal magnetic sector SIMS system for materials and semiconductors, magnetic sector SIMS system for advanced semiconductors, magnetic sector SIMS system for geoscience laboratories, ultra high sensitivity magnetic sector SIMS system for geoscience labs, high performance SIMS system for isotopic and trace element analysis at high spatial resolution, universal quadrupole SIMS system for semiconductors and materials, shielded magnetic sector SIMS system for radioactive samples (on request). CAMECA manufactures laser assisted tomographic atom probe microanalysis and imaging system providing quantitative atomic scale 3D elemental mapping of chemical heterogeneities in materials. Laser assisted tomographic atom probe microanalysis and imaging system features atomic scale depth resolution in semiconductors, excellent mass resolution even on low thermal conductivity materials, large area of analysis (up to 100 nm in diameter) for a better statistics on composition measurements, flexible and fast dedicated FIM (field ion microscopy) detector for metallurgical applications. CAMECA manufactures electron probe microanalysis system (EPMA system) for materials science and geosciences. Electron probe microanalysis system featured fully integrated optical microscope, up to 5 wavelength dispersive spectrometers (WDXRF spectrometers), + energy dispersive spectrometer (EDXRF spectrometer), high voltage electron gun operates at up to 40 kV for elements with high atomic number, trace element measurements and high speed X-ray mapping. Also manufactures shielded electron probe microanalysis system for radioactive samples. Electron probe microanalyzer system are equipped with a complete kit of built-in microscopy tools that allow simultaneous X-ray (WDXRF and EDXRF), SEM and BSE imaging. CAMECA manufatures process control systems for the semiconductor manufacturing industry (metrology tools): in-line low energy X-ray emission spectrometer system, near-line full wafer magnetic sector SIMS analyzer, automated, full wafer quadrupole SIMS analyzer.
Carl Zeiss AG.
Carl Zeiss is a manufacturer of analytical and scientific equipment: optical microscopes, fluorescence microscopy systems, microimaging systems for biology and medical sciences, materials analysis, scanning electron microscopes, transmission electron microscopes, optical and electro-optical components (gratings, spectral sensors, spectrometer components), spectrometer systems, dedicated analytical solutions (process analyzers, concentration measurement systems). Carl Zeiss manufactures lab and process spectrometer systems (UV-VIS-NIR range)- at-line, in-line, on-line analyzer systems for the measurement of color, concentration and layer thickness. Carl Zeiss manufactures fiber optic process spectrometer - analyzer system for process measurement and control.
ChemImage.
ChemImage is a manufacturer of spectrometer systems for chemical imaging (molecular spectroscopy + digital imaging = molecular images that detail material morphology, composition, structure, concentration). ChemImage manufactures Raman spectrometer based chemical imaging system for a wide range of researh and industrial applications (Raman chemical imaging + broadband UV-excited fluorescence chemical imaging + laser-excited fluorescence chemical imaging + near-infrared or NIR chemical imaging + visible absorption chemical imaging)- for materials analysis, pharmaceuticals analysis and quality control (blend uniformity and particle sizing of tablets, coating layers chemical identity, percent composition determination of active and inactive ingredients, thickness uniformity and interfacial chemistries of controlled-release systems, ingredient-specific particle sizing of nasal sprays, emulsions, suspensions). Spectrometer system provides the non-invasive pharmaceuticals imaging and analysis through packaging, such as blister packs, glass containers, plastic bags.
ChemImage manufactures macroscopic chemical imaging system for forensic applications, such as determination of forensic samples morphology. ChemImage manufactures transportable, mobile fluorescence microscope + Raman spectrometer system for on-site detection and identification of hazardous materials, chemical warfare agents, patogenic organisms in a wide range of solids and liquids. ChemImage is a developer of chemical imaging software that allows simultaneous visualization and manipulation of images and spectra.
Cianflone Scientific Instruments Corporation.
Cianflone Scientific Instruments Corporation is a manufacturer of lab (bench top) X-ray spectrometers for composition and coating thickness measurements (XRF analyzers), and related laboratory sample preparation equipment (blender mill for sample grindind and electric arc furnace for sample remelt).
EDAX.
EDAX (a member of the AMETEK Materials Analysis Division) is a manufacturer of micro-XRF analyzers, EDS and WDS detectors for SEM systems, TEM systems (X-ray microanalysis systems for electron microscopes), EBSD systems for scanning electron microscopes (crystallography, microstructural analysis using electron backscatter diffraction). EDAX manufactures wavelength dispersive X-ray spectrometers that will fit on all electron microscopes (SEM, TEM systems). EDAX also manufactures integrated material characterization systems: EDS + EBSD system, EDS + WDS system, EDS + EBSD + WDS system. EDAX manufactures micro-XRF analyzers (micro-XRF spectrometers)- X-ray microanalysis instruments for non-destructive micro-spot elemental analysis, coating thickness and composition measurements, quality control in microelectronic industry, RoHS, geology, mineralogy, forensic inquiry.
FEI Company.
FEI Company is a manufacturer of scanning electron microscopes (SEM systems), transmission electron microscopes (TEM systems), dualbeams instruments (SEM/FIB systems), and focused ion beam instruments (FIB systems). FEI Company manufactures scanning electron microscopes (SEM systems) with EBIC, STEM, EDS, WDS, EBSD, and field emission gun (FEG/SEM) capabilities. FEI Company manufactures transmission electron microscopes (TEM systems) and scanning / transmision electron microscopes (S/TEM systems). FEI Company manufactures FIB/SEM systems for transmission electron microscope sample preparation (TEM sample preparation), microanalysis, 3D microscopy, 3D defect characterization, failure analysis, industrial failure analysis, process control applications, and . The FIB/SEM systems features three SEM imaging modes (high vacuum, low vacuum, ESEM), integrated focused ion beam (FIB) adds cross sectioning capabilities. ESEM mode allows in situ study of the dynamic behavior of materials at different humidity levels (up to 100% RH) and temperatures (up to 1500° C). FEI Company offers full wafer DualBeam microscopes with 300mm capability for fast and accurate 3D defect characterization, failure analysis and transmission electron microscope (TEM) sample preparation. FEI Company manufactures defect analyzer system combining tool automation, electron imaging, focused ion beam milling, and proprietary beam chemistry technology to enable three-dimensional analysis of advanced process defects. FEI Company manufactures focused ion beam systems (FIB systems) provides effective cross-sectioning, imaging and transmission electron microscopy (TEM) sample preparation.
Gatan, Inc.
Gatan manufactures instrumentation and software used to enhance and extend the operation and performance of electron microscopes (SEM, TEM systems). Gatan is a manufacturer of spectrometers, spectrum imaging devices for SEM and TEM systems, X-Ray microscopes, specimen preparation equipment, specimen holders for transmission electron microscopy. Gatan manufactures a range of analytical holders, cooling and cryo transfer holders, environmental cell and vacuum transfer holders, heating, straining and multiple specimen transfer holders and tomography holders. Gatan manufactures cooled CCD cameras for transmission electron microscopes (CCD cameras provides a TEM with both high-resolution digital imaging and analytical capabilities). Gatan manufactures electron energy loss spectroscopy (EELS) and energy-filtered TEM (EFTEM) systems for analytical TEM applications. Spectrometer systems for analytical TEM provides information about material samples probed by a transmitted electron beam, including sample thickness, elemental and chemical composition, electronic structure and energy levels, frequency-dependent dielectric response, and element-specific radial distribution of atoms. Gatan offers devices and software to enhance and support scanning-mode TEM (STEM) analysis, including digital beam scan and imaging systems, STEM detectors optimized for the STEM EELS technique, EDS data acquisition and analysis software, spectral imaging and analysis software. Gatan manufactures cathodoluminescence imaging systems, spectroscopy and spectrum imaging systems, cryo-SEM equipment. Gatan offers software suite for EELS and EFTEM compositional mapping, TEM auto-tuning, diffraction pattern analysis, and 3D tomography-acquisition. Gatan manufactures a specially designed ultra-microtome for life science researchers, operating in situ within a variable pressure, field emission SEM, allowing automated acquisition of 3D ultrastructure by sequentially imaging the freshly cut, resin embedded block face. Gatan also manufactures the SEM-hosted high resolution X-ray microscope providing an internal view of the structure of samples without cross-sectioning (X-ray microscopy + scanning electron microscopy = 3D tomographic imaging).
Helmut Fisher GmbH.
Helmut Fisher GmbH is a manufacturer coating thickness measurements instruments (coating thickness meter, thickness gauges, X-ray fluorescence coating thickness and composition analyzers) and material testing instruments (hardness testing instruments, microhardness measurement instruments, coating porosity testing instruments, sealing quality tester for anodic coatings on aluminum). Helmut Fisher manufactures energy dispersive X-Ray fluorescence spectrometers for materials and multi-dimensional coating analysis, RoHS and WEEE testing. In combination with the application kit Gold Assay, these XRF instruments also provides the fast, non-destructive and accurate gold content measurement in jewelry and precious metals.
Hiden Analytical Ltd.
Hiden Analytical Ltd is a manufacturer of quadrupole mass spectrometers for gas analysis and secondary ion mass spectrometers (SIMS) for surface analysis, sorption characterisation instrumentation (gravimetric analysers) and multistream valves. Hiden Analytical Ltd is a manufacturer of DSMS series gas analyzers (dynamic sampling mass spectrometers) for high precision gas purity analysis, residual gas analysis, quantitative gas analysis for gas reaction studies, on-line process control and gas composition measurements. Hiden Analytical Ltd is a manufacturer of SIMS systems (secondary ion mass spectrometers) for surface & interface analysis, fundamental surface studies and routine industrial sample analysis. Hiden Analytical Ltd is a manufacturer of sorption characterisation instrumentation measuring gas and vapour sorption and moisture sorption, sorbent characterisation. Hiden Analytical manufactures intelligent gravimetric analysers for gas & vapour sorption characterisation.
The Hiden Analytical’s HPR-20 dynamic sampling mass spectrometry system is a bench mounted, cart mounted or console configured system for continuous analysis of gases at pressures upto atmosphere. Features high sensitivity and stability together with wide dynamic range.
The Hiden Analytical’s EQS secondary ion mass spectrometer for static and dynamic SIMS applications features combined sector field analyser and triple filter quadrupole mass spectrometer. Ionised species with masses up to 1000 amu may be analysed. An integral electron impact ion source is utilised for conventional RGA, leak detection and Secondary Neutral Mass Spectrometry (SNMS). The EQS employs a high performance triple quadrupole filter and sector field analyser with DC quadrupole input focusing lens. Ions passing through the instrument have simple curved trajectories with virtually 100% transmission within the pass band. 
The Hiden Analytical’s SIM Probe is a compact bolt-on probe combining an in-line energy analyser with a quadrupole mass spectrometer for surface mapping, depth profiling and interface analysis. Features in-line Bessel Box energy analyser and triple filter quadrupole mass spectrometer. A built-in ion source permits the analysis of sputtered neutrals as well as standard RGA for vacuum chamber diagnostics. In Multiple Ion Detection (MID) mode, positive and negative ions of different mass and energy can be selectively and simultaneously monitored. This allows the user to optimise the SIMS analysis for each ion of interest and to do trend analysis of the selected ions for depth profiling applications.
The Hiden Analytical’s Moisture Sorption Analyser IGAsorp is designed to accurately measure the magnitude and kinetics of moisture sorption onto materials. It is fully automated and combines an ultra sensitive microbalance with precise measurement and control of both humidity and temperature. The IGA series of instruments uniquely utilise the IGA method to intelligently determine equilibrium uptakes and kinetics. It is a bench top system specially developed for the pharmaceutical, food and packaging industries. Suited to QA testing and product R&D. Optional Upgrade to run with Organic Vapours.
HORIBA.
Horiba is a manufacturer of optical spectroscopy instruments (fluorescence, Raman spectrometers and microscopes, NIR spectrometers, NDIR, FTIR gas analyzers, UV spectroscopic process gas analyzer, ambient ozone monitor, UV fluorescence sulfur in-oil analyzer), electrochemistry instruments, elemental analysis instruments (ICP-OES, glow discharge spectrometers, XRF spectrometers, EDXRF microspectrometer, XRF sulfur in-oil analyzers, C, H, N, O, S analyzers), environmental analysis instruments, emissions measurement instruments (air pollution analyzers, engine exhaust gas analyzers, stack gas analyzers, continuous emission monitoring systems, CEMS), water analysis instruments (handheld water quality meters, process water analyzers, water quality monitors), particle size, particle shape, zeta potential, and surface area analysis instruments (particle size, particle shape analyzers, surface area analyzers, zeta potential analyzers), thin film measurement instruments (ellipsometers). Horiba also manufactures gratings and OEM mini CCD spectrometers.
IXRF Systems, Inc.
IXRF Systems is a manufacturer of EDS microanalysis and imaging systems for electron microscopes, EDS detectors, EDS system upgrades, integrated X-ray fluorescence microanalysis systems for scanning electron microscopes (integrated XRF analysis in the SEM). IXRF Systems manufactires a complete EDS systems, EDX/EDS microanalysis systems, upgrades for existing EDS systems, EDS detector upgrades, such as light element windows, crystal changes. IXRF Systems manufactures X-ray fluorescence (XRF) microanalysis instruments for scanning electron microscopes: collimated X-ray source providing a 500 micron to 5mm X-ray spot analysis in the SEM, and micro-XRF analyzer system (X-ray spot sizes around 40-60 microns or larger). The key benefit is a reduced background - very low elemental analysis (ppm) can be performed. The X-ray fluorescence (XRF) microanalysis instruments uses SEM stages for creating elemental maps at the ppm level. The micro-EDXRF spectrometer system for scanning electron microscopes incorporates a polycapillary focusing optic to focus the x-ray beam, creating an excitation area of about 40 microns. The collimated X-ray source for SEM and micro-XRF spectrometer system can be adapted to just about any electron microscope and used with any EDS system.
JASCO.
Jasco is the analytical instrument and scientific instrument company, manufacturer of instrumentation for optical spectroscopy ( FT-IR spectrometers and IR microscopes, Raman spectroscopy systems, spectrofluorimeters, polarimeters), and high performance liquid chromatography (HPLC instruments and systems, SFC, SFE equipment and systems), dissolution testing (tablet dissolution tester). Jasco (JASCO Corporation) is a one of the world leading manufacturers of the research-grade optical spectroscopy instrumentation and high performance liquid chromatography instrumentation. Jasco manufactures UV-Visible-NIR spectrometers (UV-Vis-NIR spectrophotometers), FT IR spectrometers and  FT/IR microscope accessory (IR microscope for rapid IR imaging), FT Raman spectrometery systems and dispersive Raman spectrometers, fluorescence spectrometers (spectrofluorimeters), circular dichroism spectrometers, digital polarimeters. Jasco manufactures two infrared microscope models which can be easily interfaced to FTIR system (for Jasco FTIR spectrometers only). Jasco manufactures mobile (compact, lightweight and transportable) FT-IR spectroscopy system. Mobile FT-IR spectroscopy system with IR microscope module can be used as mobile FTIR microscopy system. Mobile FT-IR spectrometer with fiber-optic probe or diffuse reflectance accessory can be used for on-site, on-line composition analysis of liquids, solid samples, powders. Jasco also supplies software package for optical spectroscopy.
JEOL Ltd.
JEOL Ltd is a manufacturer of transmission electron microscopes (TEM systems), scanning electron microscopes (SEM systems), electron probe micro analyzers (EPMA), Auger microprobe analyzers (AES), scanning probe microscopes (SPM systems), X-Ray  photoelectron spectrometers (XPS systems), nuclear magnetic resonance spectometers, electron spin resonance spectormeters, mass-spectrometers, MS/MS, GC/MS systems, LC/MS systems, X-ray fluorescence spectrometers, amino acid analyzers, clinical biochemistry analyzers, laboratory information systems. JEOL manufactures a broad range of electron microscopes and surface microanalysis instruments, including: transmission electron microscopes, scanning electron microscopes, analytical scanning electron microscopes (SEM + optional energy dispersive X-ray spectrometer, EDS for elemental analysis), scanning probe microscopes, field emission Auger microprobe analyzers, electron probe microanalyzers (EPMA, up to 5 energy dispersive X-ray spectrometers for elemental analysis), X-Ray photoelectron spectrometers. JEOL manufactures double-focusing magnetic sector mass spectrometers and MS-MS systems, dioxin analysis MS system, magnetic sector GC-MS system, quadrupole GC-MS system, TOF GC-MS system, and TOF API HPLC-MS system. JEOL manufactures high performance, research grady nuclear magnetic resonance spectometers, electron spin resonance spectormeters (high resolution NMR spectrometers, ESR spectrometers). JEOL manufactures X-ray fluorescence spectrometers (XRF spectrometer). JEOL also manufactures amino acid analyzers, clinical biochemistry analyzers.
Jordan Valley Semiconductors Ltd.
Jordan Valley Semiconductors is a manufacturer of automatic film thickness and composition measurement systems, multichannel thin-film materials research and quality control instruments. Jordan Valley Semiconductors provides metrology solutions for thin films based on rapid, non-contacting and non-destructive X-ray technology for the semiconductors industry. Jordan Valley Semiconductors manufactures a comprehensive suite of X-ray metrology tools for for the semiconductor and microelectronics industries. In April 2008, Jordan Valley Semiconductors extended its business with the acquisition of Bede, a supplier of high-resolution XRD metrology solutions for the semiconductor and compound industries. The company offers a complete family of automation metrology solutions based on high-speed, non-destructive XRR (X-ray reflectance), micro-XRF (micro-spot X-ray fluorescence), SAXS (small angle X-Ray scattering), HRXRD (high resolution X-ray diffraction) and WAXRD (wide angle X-ray diffraction) technologies. Jordan Valley Semiconductors manufactures flexible X-ray diffraction instruments for thin-film materials research, process development, and quality control. Jordan Valley Semiconductors manufactures high resolution X-ray diffractometer - high resolution X-ray diffraction tool for semiconductor development and quality control.
J.A. Woollam Co., Inc.
J.A. Woollam Company, Inc is a manufacturer of spectroscopic ellipsometry hardware and software. J.A. Woollam Company, Inc manufactures equipment for thin film characterization by spectroscopic ellipsometry. J.A. Woollam Company, Inc is a manufacturer of spectroscopic ellipsometers in the infrared, visible, and deep ultraviolet region. Non-destructive materials characterization of multi-layer thicknesses, optical properties (complex dielectric function), composition, anisotropy, doping concentration, and much more. The VUV-VASE - The J. A. Woollam Company now has a second generation Vacuum Ultraviolet ellipsometer designed to accommodate large samples and photomask or wafer mapping.
Kore Technology Limited.
Kore Technology Limited is a manufacturer of scientific and analytical instruments for time-of-flight mass spectrometry: field portable TOF-MS for air and gas analysis, TOF-SIMS for surface chemical analysis, BIOTOF-SIMS chemical imaging time-of-flight mass spectrometer for life sciences, TOF mass spectrometry components and electronics (reflectrons, time-of-flight spectrometer power supplies and timing electronics - time to digital converter). Kore Technology Limited manufactures a various modules to assist in building time-of-flight data acquisition systems. Kore Technology Limited specialises in the development and supply of innovative time-of-flight mass analysers to detect and measure ultra-low level contaminants and time-of-flight instrument upgrades (service and upgrade old Kratos TOF-SIMS and VG TOF-SIMS). Kore Technology Limited is a manufacturer of sample handling equipment and stages (the rotating stage and other sample handling products). Kore Technology Limited also manufactures Cassegrain lens (this all-metal reflecting optics lens was originally designed as a long working distance, in-vacuum, on-axis lens yielding sub-micron diameter spot sizes for laser microprobe mass analysers).
Featured products: The MS-200 Portable Mass Spectrometer is a field portable, battery powered TOF mass spectrometer for gas analysis entirely contained in a single case. MS-200's membrane inlet concentrator allows a wide range of gases to be identified and measured from the low p.p.b. range up to percent levels. Automatic mixture analysis software in the MS-200 eliminates the need of a GC interface. The MS-200 uses electron impact ionisation, yielding spectra that correspond to extensive and well established mass spectral databases.
The MS-1000 Compact Secondary Ion Time-Of-Flight Mass Spectrometer for Surface Analysis is a bench-top scale analyser that identifies the chemistry and molecular structure of the surface of solid samples. MS-1000 is a time-of-flight Secondary Ion Mass Spectrometer (TOF-SIMS) and operates in the static mode of SIMS; meaning that it is highly sensitive and analyses only the top most layer of molecules on the sample. The MS-1000 easy to use and has a fast sample turnaround time of 15 minutes. MS-1000 is designed for product quality control and fault diagnosis at or close to the point of manufacture, to use is areas where other surface analysers have proved uneconomical or technically unfeasible.
The MS-2000 BIOTOF-SIMS - An affordable research grade chemical imaging time-of-flight mass spectrometer. MS-2000s are being used to study bio-systems that require high spatial resolution surface analysis, such as self-assembly monolayer systems, locating molecules in cell surfaces and spatially sequencing proteins particularly to build up combinatorial libraries.
Kore Technology Limited is a supplier of Galileo electron multiplier detectors. A wide range of detector options based on both microchannel plates, and on channeltrons. Kore Technology Limited represents Galileo in Europe for both detector types (Galileo Corporation's Scientific Detector and Spectroscopy Products Business acquired by Burle Industries Inc, the successor company to the RCA New Products Division located in Lancaster, PA USA, a major U.S manufacturer of vacuum tube products, including photomultiplier tubes, power tubes, and imaging tubes).
Kore Technology Limited is a licensed reseller of the widely used and highly respected NIST mass spectral library of electron impact (EI) ionisation spectra.
Kratos Analytical Limited.
Kratos Analytical Limited is a manufacturer of XPS instruments for surface analysis and mass-spectrometry instruments for life sciences (MALDI TOF MS systems for biochemical applications, proteomics, combinatorial chemistry). Kratos Analytical is a wholly owned subsidiary of the Shimadzu Corporation. Kratos Analytical manufactures a family of X-ray photoelectron spectrometers (XPS microanalysis systems) for surface analysis and imaging.
Nano Scan Technology.
Nano Scan Technology (scientific instrument company, Russia) is a manufacturer of instrumentation for surface characterization and microanalysis by scannig probe microscopy, optical microscopy, scanning confocal laser microscopy, Raman spectroscopy and fluorescence spectroscopy. Nano Scan Technology manufactures scannig probe microscope, combined scannig probe microscope + optical  microscope system, sophisticated scannig probe microscope + scanning confocal laser microscope + Raman microscope / fluorescence microscope system, scannig probe microscope + cryo-ultramicrotome system.
Nytek Instruments.
Nytek Instruments is a supplier of fluorescence spectrometers and microscopes, Raman spectrometers, Raman microscopy systems, thin film measurement instruments (ellipsometers), ICP-OES systems, glow discharge spectrometers, XRF spectrometers, EDXRF microspectrometer, XRF sulfur in-oil analyzer, UV fluorescence sulfur in-oil analyzer, C, H, N, O, S analyzers. Nytek Instruments supplies optical components and modules, instrument parts, accessories and consumables for chromatography and spectroscopy. The company also supplies pure gas generators, oilless compressors, pure air generators.
Oxford Instruments plc.
Oxford Instruments (UK) is a manufacturer of analytical instruments and scientific equipment. Oxford Instruments manufactures portable X-ray fluorescence instruments, handheld XRF metal analyzers, alloy testers (hand-held XRF analyzers for PMI, positive material identification, alloy analysis, alloy identification, RoHS, hazardous material analysis), laboratory XRF spectrometers (XRF sulfur in oil analyzer, sulphur in petroleum analyzers), coating thickness and material composition measuring instruments (coating gauges, XRF coating analyzers), optical emission metal analyzers, OES alloy testers (mobile OES metal analyzers, OES PMI systems,OES alloy sorters, laboratory high performance OES metal analyzers). Oxford Instruments manufactures X-ray microanalysis attachments, microspectrometer systems for scanning electron microscopes, SEM systems, transmission electron microscopes, TEM systems (EDS, energy dispersive microanalysis system, WDS, wavelength dispersive microanalysis system, EBSD, electron backscatter diffraction microanalysis system). Oxford Instruments manufactures X-ray tubes and components (low power X-ray tubes, small focal spot X-ray tubes, highly stable X-ray tubes, mono-blocks packaged X-ray tubes, microfocus X-ray source, portable X-ray sources).
Parallax Research, Inc.
Parallax Research is a manufacturer of X-ray microanalysis instruments (X-ray microspectrometers), X-ray optics and X-ray components for scanning electron microscopes, transmission electron microscopes, electron probe microanalyzers, Auger microanalyzers. Parallax Research manufactures wavelength dispersive microspectrometers (WDS), energy dispersive microspectrometers (EDS) and WDS + EDS microanalysis package for SEM and TEM systems, electron probe microanalyzers (EPMA), Auger microanalyzers. The company specializes in low energy (light elements) X-ray microanalysis. Parallax Research manufactures attachable low-energy X-ray optic for energy dispersive microspectrometers. Parallax Research also manufactures proportional counters for use in X-ray microanalysis instruments and XRF spectrometers, components for interfacing X-ray microanalysis instruments to SEM systems.
PerkinElmer Inc.
PerkinElmer is a manufacturer of atomic absorption spectrometers, inductively coupled plasma-optical emission spectrometers (ICP-OES systems, ICP-AES systems), inductively coupled plasma mass-spectrometers (ICP-MS systems), CHNS/O systems, UV, UV/Visible spectrometers, FT-IR, FT-NIR, Raman spectrometers, microscopes and imaging systems, fluorescence spectrometers, GC instruments, GC/MS systems, HPLC instruments, UHPLC instruments, LC/MS systems, thermal analysis instruments (STA, DMA, TGA-FTIR, TGA-MS systems), calorimeters (DSC systems). PerkinElmer also manufactures lab automation systems, automated liquid handling equipment, lab robotics, microplate readers, high throughput screening systems, neonatal screening systems, prenatal screening systems, clinical diagnostics systems, radiometric detectors (luminescence counters, gamma counters, beta counters, liquid scintillation spectrometer, flow scintillation analyzers). PerkinElmer also offers software, data handling systems for chromatography and spectroscopy, LIMS.
Physical Electronics Inc.
Physical Electronics Inc is the analytical instrument company provides a complete line of scientific and analytical instruments for surface analysis including: AES, ESCA, TOF-SIMS and D-SIMS based instrumentation. Physical Electronics is a developer, manufacturer and supplier of surface analysis instrumentation which utilizes the Auger, ESCA/XPS, Dynamic SIMS and TOF-SIMS techniques.
PIKE Technologies Inc.
PIKE Technologies Inc is a developer, manufacturer and supplier of optical spectroscopy accessories and optical systems enhancing performance and extending use of commercial FTIR spectrometers. PIKE Technologies Inc manufactures a wide range of Attenuated Total Reflectance (ATR), Diffuse Reflectance (DRIFT), Specular Reflectance and Transmittance accessories are available. These products replace traditional techniques used in infrared analysis and provide reliable alternatives to liquid cells, KBr disks and pellets. This new generation of sampling devices is easy to use, and to maintain, which results in better productivity and cost savings. PIKE products are available for direct analysis of liquids, powders, pliable solids and other organic materials. ValuLine offers an inexpensive, manual set of the basic accessories designed for routine use. Research grade products built for more demanding applications and a full range of automated systems for unattended analysis and QC/QA work are also available. A dedicated group of products is designed to assist in analysis of chemical composition of silicon wafers and electronic storage media. PIKE Technologies accessories fit all FTIR spectrometers.
uMAX - Sample Compartment IR Microscope - PIKE Technologies offers microsampling accessories which demagnify the FTIR beam to a smaller dimension and thereby increase IR throughput for small samples. 
Polychromix.
Polychromix is the American analytical instrument company, manufacturing truly portable (handheld) NIR analyzers, compact, transportable benchtop NIR spectrometers with fiberoptic sample accessory, and portable light sources.
Polytec GmbH.
Polytec GmbH (Waldbronn, Germany) is a manufacturer of optical measurement and analytical equipment (modular diode array NIR spectrometer systems and components, laser surface velocimeters, laser vibrometers, microscope-based systems to measure the dynamics and topography of microsystems and micro-electromechanical systems, MEMS, dynamic stress and strain measuring instruments, surface metrology instruments, 3-D profilometers for surface characterization, HDD media tester, optical surface analyzer for nano-defect and topography measurements of HDD media). Polytec GmbH manufactures modular NIR spectrometer systems for online process control and laboratory measurement. The modular NIR spectrometer system includes sensor head (remote reflection sensor head, contact reflection sensor head, transmission sensor head, immersion probe) + diode array NIR spectrometer and software.
Quantum Equipment Co. Ltd.
Quantum Equipment Co Ltd is a manufacturer of X-ray fluorescence analyzer, gold alloy analyzers and thickness meter, for laboratory, process and on-site applications. Product lines: GoldCheck - Gold Alloy Analyzer, LX-400P - Laboratory XRF Elemental Analyzer, ComPact - XRF Thickness Tester.
GoldCheck - Gold Alloy Analyzer is a karatmeter for gold alloys and precious metals. Gold Check is the proper tool for fast, non-destructive and accurate karat measurement of precious metals and finished jewellery. The results are displayed in karat (percentage) on computer monitor and can be printed on any standard printer. Only in a few minutes the determination of the content of metals in alloys with accuracy of <0.3% and lowest concentrations of 0.5%. Measurement of feligree parts of a sample can analysed by the collimation of the exciting beam to 0.3 or 0.5 mm. The compact sample chamber dimensions allow testing of all kinds of different dimensioned parts. Positioning of even the smallest parts can be done with video microscope with 25-x magnification and an electronic crosshair. The size of the X-ray beam on the sample is indicated electronically on the monitor. 
Gold Alloy Analyzer is robust and work satisfactorily in any harsh and friendly environments, thus making it the most suitable to keep in jewellery showrooms, boutiques or any outlets where personnel can operate very easily. Several options software models are available for elemental analysis, thickness measurement, plating both analysis, alloy sorting, report generation, statistical database prevention.
X-ray Compact - XRF Thickness Tester provides a universal coating / plating thickness measurement and material chemical analysis at extremely reasonable price. The modular design of the system allows customer to grow with his needs in addition to high precision, ease of use and versatility. The precise non-destructive thickness measurement, even of multiple layers is performed in few seconds. The thickness and composition of alloys can be determined simultaneously with full qualitative and quantitative possibilities. Additionally the unit performs a plating bath analysis and is a complete solution for plating, electronic, connector, printed circuit board and related industries. Number of comprehensive range of optional accessories like X-Y-Z programmable stage, auto focusing, point and shoot, statistical calculation packages etc. are available.
LX-400P - Laboratory XRF Elemental Analyzer measures elements from sodium (Na) to Uranium (U) on periodic table from few ppm to 100% in various forms of samples ranging from powder, solid, liquid, granules, slurry, pastes. This standalone analyzer with built-in LCD display and alpha-numeric keypad is a good choice of laboratory XRF elemental analyzer for all analytical needs. The options like auto-sampler, sample spinner, computer interface package are available and can be upgraded even at later stage.
Rigaku Corporation.
Rigaku Corporation and its subsidiary companies manufactures X-ray spectrometers (WDXRF, EDXRF instruments), X-ray diffractometers (single crystal X-ray diffraction instruments, protein and small molecule XRD systems), small angle X-ray scattering (SAXS) instruments, thermal analysis instruments, and lab automation products (laboratory robotics). Rigaku manufactures bench top total reflection X-ray fluorescence (TXRF) spectrometer, performs elemental analysis down to PPB levels, energy dispersive X-ray fluorescence (EDXRF) elemental analyzers, in-line X-ray transmission sulfur analyzer (process, on-line XRT sulfur gauge for crude oil, marine bunker fuel and blending operations). Applied Rigaku Technologies, Inc. division in Austin, Texas USA is dedicated to designing, manufacturing and supporting EDXRF benchtop spectrometers - elemental analyzers as well as at-line, on-line, real-time process control elemental analysis instrumentation (provides both elemental analysis + thickness and composition measurement of multi-layer thin films). The company manufactures the semiconductor metrology instrumentation. Rigaku specializes in manufacturing XRF, XRD and XRR metrology tools to measure critical process parameters like thin film: thickness, composition, roughness, density, porosity, and crystal structure. Rigaku manufactures process TXRF and VPD-TXRF tools for contamination measurement, including in-line X-ray metal film monitor designed for high-throughput, product-wafer measurements. Rigaku manufactures X-ray optics, X-ray generators and detectors for scientific instruments, including microfocus rotating anode X-ray generator, X-ray sources for macro-molecular crystallography, low-noise CCD imaging detectors. Rigaku Corporation also manufactures X-ray stress analyzer for materials science.
Rigaku Corporation manufactures thermal analysis instruments: thermogravimetric analysis - differential thermal analysis instruments (humidity-controlled, high temperature TG-DTA system), differential scanning calorimetry instruments (DSC systems, differential scanning calorimeters), thermomechanical analysis instruments (humidity-controlled thermomechanical analyzer, high temperature thermomechanical analyzer, options for TMA instruments). Rigaku also offers evolved gas analysis (EGA) solutions: temperature programmed desorption systems, TG-DTA-GC-MS system, TG-DTA-mass-spectrometer system.
Roenalytic GmbH (formerly Roentgenanalytik Messtechnik GmbH).
Roenalytic GmbH (Germany, until October 2008 known as Roentgenanalytik Messtechnik GmbH) is a manufacturer of X-ray fluorescence analyzers (X-ray fluorescence instrument company). Roenalytic GmbH manufactures X-ray fluorescence spectrometers for coating thickness and composition measurement, microanalysis, determination of precious metals, fast, non-destructive and accurate Karat-measurement of precious metals and finished jewellery. Roenalytic GmbH manufactures XRF precious metals analyzer - X-ray fluorescence spectrometer for fast, non-destructive and accurate Karat-measurement of precious metals and finished jewellery (noble metals analyzer, XRF gold analyzer features sample positioning by a video system and a sample stage). The company manufactures a family of micro-XRF analyzers for small parts and inclusions spot analysis, materials and coatings elemental mapping, ROHS/WEEE measurements (micro X-ray fluorescence spectrometers with beam concentration by capillary optics, possible spot sizes range from 20 µm to 300 µm). Roenalytic GmbH manufactures XRF sediment core analyzer - a micro beam X-Ray fluorescence spectrometer designed specifically for the measurement of the elemental distribution of layered sediment cores.
Scientific Instruments (Научные Приборы).
Scientific Instruments (Saint Petersburg, Russia) is a manufacturer of  X-ray fluorescence spectrometers (laboratory XRF analyzer, portable XRF analyzer), XRF microspectrometer, XRD instruments (X-ray diffractometers, X-ray microdiffractometer), laser particle size analyzer.
Shimadzu Corporation.
Shimadzu Corporation is one of the world's leading analytical instrument and scientific instrument companies, a manufacturer of analytical equipment (gas chromatography, liquid chromatography instruments and systems, portable ion chromatography systems, mass spectrometry, optical spectroscopy, X-Ray spectroscopy instruments and systems, elemental analyzers, thermal analyzers), laboratory equipment (electronic laboratory balances, analytical balances, moisture determination balances - balance moisture analyzers), measuring equipment (calorimeters, moisture meters, viscometers, rheometers, particle size analyzers, force gauges, specific gravity meters), scientific equipment (XRF spectrometers, X-ray diffractometers, surface analysis instruments: scanning electron microscopes, scanning probe microscopes), materials testing equipment (material testing machines, hardness tester systems).
Shimadzu Corporation manufactures a broad range of elemental analysis and spectroscopy equipment, instruments, systems: TC, TN, TIC, TOC analyzers (total carbon analysers, total nitrogen analyzers, total inorganic carbon analysers, total organic carbon analyzers), atomic-absorption spectrometers (flame and graphite furnace AAS instruments), spark optical emission spectrometers for metal analysis and alloy identification (OES metal analyzers), ICP spectrometers, FT-IR spectrometers and FTIR microscopes (FT-IR microanalysis systems), UV-visible spectrophotometers, fluorescence spectrometers, MALDI-TOF mass spectrometry systems, X-ray fluorescence spectroscopy and X-ray diffractometry instruments (X-ray fluorescence spectrometers and X-ray diffractometers), optical components (holographic gratings), consumable products, parts and accessories for spectroscopy and elemental analysis.
Shimadzu Corporation manufactures scanning electron microscopes (SEM systems), analytical scanning electron microscopes (SEM-EDX combined microanalysis system), scanning probe electron microscopes (SPM systems), electron probe microanalyzer (EPMA), and energy dispersive micro X-ray fluorescence spectrometer (micro-EDXRF spectrometer system).
Shimadzu Corporation is a manufacturer of particle characterization instruments and systems, laser diffraction particle size analyzers, calorimetry instruments and thermal analysis systems (differential scanning calorimeters, thermoanalysis system, TGA-DSC systems), materials science insruments and materials testing equipment (capillary rheometers, Mooney viscometers, universal material testing machines, concrete compression testing machines, fatigue testing machines, universal material testers, impact testers, hardness testers, tensile testers, microhardness testers, microtensile testers).
Simex (Симекс).
Simex (Novosibirsk, Russia) is a manufacturer of FT-IR spectroscopy and microspectroscopy instrumentation. Simex manufactures FTIR spectrometer and FTIR microscope systems (FTIR microspectrometers).
Skyray Instrument.
Skyray Instrument (China) is a manufacturer of energy dispersive X-ray fluorescence spectrometers (EDXRF spectrometers), wavelength dispersive X-ray fluorescence spectrometers (WDXRF spectrometers), ICP-AES system, spark OES metal analyzer, atomic fluorescence spectrometer, CS analyzer. Skyray Instrument manufactures lab and portable X-ray fluorescence spectrometers for elemental composition analysis, metal analysis, plating thickness measurement, jewellery alloys and precious metals analysis, RoHS / WEEE compliance testing. Skyray Instrument offers XRF spectrometers designed for RoHS substance detection (Cd, Pb, Cr, Hg, Br), element composition analysis, precious metals testing and plating thickness measurement. Skyray Instrument manufactures XRF spectrometers (XRF analyzers) specially designed for jewelry and precious metal analysis (Au, Ag, Pt, Pd), plating thickness analysis (plating thickness measurements of jewelry coatings). Skyray Instrument manufactures WDXRF spectrometer specially designed for cement, steel, and mine production quality control, features excellent performance for light elements as Na, Al, K, Ca, Mg, Si, P. Skyray Instrument manufactures process, on-line XRF spectrometer. The company also manufactures ICP-OES system, spark OES metal analyzer, atomic fluorescence spectrometer, CS analyzer.
SOLAR TII.
SOLAR TII (Minsk, Belarus) is a manufacturer of analytical and scientific instruments (laser induced optical emission spectrometer, fluorescence / Raman microanalysis system), optical components and systems (monochromators, optical parametric oscillators, spectrographs), solid-state tunable lasers. SOLAR TII manufactures atomic emission spectrometer system (laser elemental analyzer) for laser induced breakdown spectroscopy or LIBS. Laser elemental analyser is a fully automated laser induced optical emission spectrometry system for materials surface elemental analysis permitting both composition and coating layers thickness measurements. SOLAR TII manufactures laser fluorescence / Raman microanalysis system (scanning confocal microscope + laser luminescence / Raman spectrometer).
SPECS Surface Nano Analysis GmbH.
SPECS Surface Nano Analysis GmbH (Berlin, Germany) is a manufacturer of specialized spectrometer systems for surface microanalysis and imaging (surface spectroscopy and microscopy systems). SPECS Surface Nano Analysis manufactures electron spectrometers, fully automated ESCA system, secondary ion mass spectrometry + secondary neutral mass spectrometry system (SIMS + SNMS system), X-ray  photoelectron spectrometer (ultra high resolution XPS analyzer), Auger spectrometer (AES system), electron energy loss spectrometer (EELS system), low energy electron microscopy + photoelectron emission microscopy system (LEEM + PEEM system), low energy electron diffraction analyzer (LEED surface analyzer), photoemission spectrometer, time-of-flight spectrometer, scanning tunneling spectroscopy and microscopy system (STM system). SPECS GmbH manufactures a line of high resolution hemispherical energy analyzers for electron and ion spectroscopy, non-contact atomic force microscopy instrumentation (NC-AFM system), the Joule-Thomson scanning tunneling microscope. SPECS GmbH offers customized systems combining thin film preparation (MBE) with spectroscopic and microscopic options. The company also manufactures a variety of sources for deposition, excitation and charge neutralization as well as analyzers, monochromators, detectors.
Veeco Instruments Inc.
Veeco Instruments is a manufacturer of atomic force microscopes, atomic force profiler, automated AFM / AFP systems, optical interferometric profilers, 3D confocal microscopes for metrology. Veeco Instruments manufactures atomic force microscope systems (AFM), scanning probe microscopes, (SPM systems). Veeco Instruments manufactures electrochemical scanning tunneling microscope (ECSTM - features atomic-resolution STM imaging and molecular-resolution STM imaging of electrode surfaces in solution under electrochemical control), electrochemical atomic force microscope (ECAFM - features nanometer-resolution AFM imaging of electrode surfaces in solution under electrochemical control), scanning electrochemical potential microscope (SECPM). Veeco Instruments manufactures confocal laser scanning microscopes, spinning disc confocal microscopes.
Author of the catalogue - Andrey Yurievich Zhdanov. Автор каталога - Андрей Юрьевич Жданов.
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Analytical and laboratory equipment companies, scientific instrument companies. Производители и поставщики аналитического и лабораторного оборудования.
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