Аналитические приборы и лабораторное оборудование, газовые хроматографы, хромато-масс-спектрометры, газохроматографические анализаторы, приборы для ВЭЖХ, высокоэффективные жидкостные хроматографы, препаративные жидкостные хроматографы, ИК-Фурье спектрометры, Рамановские спектрометры, БИК спектрометры, промышленные БИК анализаторы пищевых продуктов, УФ спектрофотометры, флуориметры, спектрофлуориметры, атомно-абсорбционные спектрофотометры, элементные анализаторы, рентгенофлуоресцентные спектрометры для анализа металла, оптико-эмиссионные анализаторы элементного состава металлов, сплавов, спектрометры ИСП, масс-спектрометры, газоаналитические приборы, масс-спектрометрические газоанализаторы.
Manufacturers and suppliers of surface analysis equipment, surface analysis instrumentation, surface microanalysis, microspectroscopy instrumentation (FTIR microscopes, Raman microscope and imaging systems, fluorescence analytical microscopes, fluorescence microspectrometers, X-ray fluorescence microspectrometers, XRF microscopes, scanning electron microscopes, scanning probe microscopes, atomic force microscopes, transmission electron microscopes, electron probe microanalyzers, electron backscatter diffraction, EBSD, EDS microanalysis and imaging instruments for analytical SEM, TEM systems, EELS, electron energy loss spectrometers, Auger spectrometers, XPS, X-ray photoelectron spectrometers, secondary ion mass spectrometers, SIMS microprobe analyzers, microhardness testers, nanoindentors). Производители и поставщики оборудования, приборов для анализа   состава и микроструктуры поверхности образца (аналитические ИК-Фурье микроскопы, Рамановские микроскопы, флуоресцентные микроскопы, рентгенофлуоресцентные аналитические микроскопы, растровые, сканирующие, электронные микроскопы, сканирующие зондовые микроскопы, атомно-силовые микроскопы, микрозонды, просвечивающие электронные микроскопы, приборы для анализа дифракции отражённых электронов, элементного картирования, Оже спектрометры, рентгеновские фотоэлектронные спектрометры, масс-спектрометры вторичных ионов для точечного анализа поверхности материалов, микротвердомеры, наноинденторы).
Manufacturers and suppliers of electron microscopy equipment, instruments, systems (electron microscopy instrumentation)- transmission electron microscopes (TEM systems), scanning electron microscopes (SEM systems), specimen preparation equipment for electron microscopy. Производители и поставщики оборудования, приборов, систем для электронной микроскопии и микроанализа (просвечивающих и растровых электронных микроскопов, оборудования для подготовки образца для электронной микроскопии.
International companies index. Международный указатель компаний.
CAMECA (France) is a manufacturer of surface microanalysis and elemental mapping instruments for research, materials science, geology, geosciences, semiconductors, and metrology equipment for semiconductor industry. CAMECA is a business unit of the AMETEK Materials Analysis Division. CAMECA manufactures low energy X-ray emission spectrometry systems, SIMS microprobe analyzers, secondary ion mass spectrometry systems for semiconductors materials science and geosciences, EPMA, electron probe microanalysis systems for materials science and geosciences, laser assisted tomographic atom probe microanalysis and imaging systems for materials and semiconductors. The CAMECA instruments provide elemental and isotopic composition data from micron down to sub-nanometer scale. The company manufactures a broad range of secondary ion mass spectrometers for surface microanalysis: universal magnetic sector SIMS system for materials and semiconductors, magnetic sector SIMS system for advanced semiconductors, magnetic sector SIMS system for geoscience laboratories, ultra high sensitivity magnetic sector SIMS system for geoscience labs, high performance SIMS system for isotopic and trace element analysis at high spatial resolution, universal quadrupole SIMS system for semiconductors and materials, shielded magnetic sector SIMS system for radioactive samples (on request). CAMECA manufactures laser assisted tomographic atom probe microanalysis and imaging system providing quantitative atomic scale 3D elemental mapping of chemical heterogeneities in materials. Laser assisted tomographic atom probe microanalysis and imaging system features atomic scale depth resolution in semiconductors, excellent mass resolution even on low thermal conductivity materials, large area of analysis (up to 100 nm in diameter) for a better statistics on composition measurements, flexible and fast dedicated FIM (field ion microscopy) detector for metallurgical applications. CAMECA manufactures electron probe microanalysis system (EPMA system) for materials science and geosciences. Electron probe microanalysis system featured fully integrated optical microscope, up to 5 wavelength dispersive spectrometers (WDXRF spectrometers), + energy dispersive spectrometer (EDXRF spectrometer), high voltage electron gun operates at up to 40 kV for elements with high atomic number, trace element measurements and high speed X-ray mapping. Also manufactures shielded electron probe microanalysis system for radioactive samples. Electron probe microanalyzer system are equipped with a complete kit of built-in microscopy tools that allow simultaneous X-ray (WDXRF and EDXRF), SEM and BSE imaging. CAMECA manufatures process control systems for the semiconductor manufacturing industry (metrology tools): in-line low energy X-ray emission spectrometer system, near-line full wafer magnetic sector SIMS analyzer, automated, full wafer quadrupole SIMS analyzer.
Carl Zeiss AG.
Carl Zeiss is a manufacturer of analytical and scientific equipment: optical microscopes, fluorescence microscopy systems, microimaging systems for biology and medical sciences, materials analysis, scanning electron microscopes, transmission electron microscopes, optical and electro-optical components (gratings, spectral sensors, spectrometer components), spectrometer systems, dedicated analytical solutions (process analyzers, concentration measurement systems). Carl Zeiss manufactures lab and process spectrometer systems (UV-VIS-NIR range)- at-line, in-line, on-line analyzer systems for the measurement of color, concentration and layer thickness. Carl Zeiss manufactures fiber optic process spectrometer - analyzer system for process measurement and control.
EDAX (a member of the AMETEK Materials Analysis Division) is a manufacturer of micro-XRF analyzers, EDS and WDS detectors for SEM systems, TEM systems (X-ray microanalysis systems for electron microscopes), EBSD systems for scanning electron microscopes (crystallography, microstructural analysis using electron backscatter diffraction). EDAX manufactures wavelength dispersive X-ray spectrometers that will fit on all electron microscopes (SEM, TEM systems). EDAX also manufactures integrated material characterization systems: EDS + EBSD system, EDS + WDS system, EDS + EBSD + WDS system. EDAX manufactures micro-XRF analyzers (micro-XRF spectrometers)- X-ray microanalysis instruments for non-destructive micro-spot elemental analysis, coating thickness and composition measurements, quality control in microelectronic industry, RoHS, geology, mineralogy, forensic inquiry.
FEI Company.
FEI Company is a manufacturer of scanning electron microscopes (SEM systems), transmission electron microscopes (TEM systems), dualbeams instruments (SEM/FIB systems), and focused ion beam instruments (FIB systems). FEI Company manufactures scanning electron microscopes (SEM systems) with EBIC, STEM, EDS, WDS, EBSD, and field emission gun (FEG/SEM) capabilities. FEI Company manufactures transmission electron microscopes (TEM systems) and scanning / transmision electron microscopes (S/TEM systems). FEI Company manufactures FIB/SEM systems for transmission electron microscope sample preparation (TEM sample preparation), microanalysis, 3D microscopy, 3D defect characterization, failure analysis, industrial failure analysis, process control applications, and . The FIB/SEM systems features three SEM imaging modes (high vacuum, low vacuum, ESEM), integrated focused ion beam (FIB) adds cross sectioning capabilities. ESEM mode allows in situ study of the dynamic behavior of materials at different humidity levels (up to 100% RH) and temperatures (up to 1500° C). FEI Company offers full wafer DualBeam microscopes with 300mm capability for fast and accurate 3D defect characterization, failure analysis and transmission electron microscope (TEM) sample preparation. FEI Company manufactures defect analyzer system combining tool automation, electron imaging, focused ion beam milling, and proprietary beam chemistry technology to enable three-dimensional analysis of advanced process defects. FEI Company manufactures focused ion beam systems (FIB systems) provides effective cross-sectioning, imaging and transmission electron microscopy (TEM) sample preparation.
Gatan, Inc.
Gatan manufactures instrumentation and software used to enhance and extend the operation and performance of electron microscopes (SEM, TEM systems). Gatan is a manufacturer of spectrometers, spectrum imaging devices for SEM and TEM systems, X-Ray microscopes, specimen preparation equipment, specimen holders for transmission electron microscopy. Gatan manufactures a range of analytical holders, cooling and cryo transfer holders, environmental cell and vacuum transfer holders, heating, straining and multiple specimen transfer holders and tomography holders. Gatan manufactures cooled CCD cameras for transmission electron microscopes (CCD cameras provides a TEM with both high-resolution digital imaging and analytical capabilities). Gatan manufactures electron energy loss spectroscopy (EELS) and energy-filtered TEM (EFTEM) systems for analytical TEM applications. Spectrometer systems for analytical TEM provides information about material samples probed by a transmitted electron beam, including sample thickness, elemental and chemical composition, electronic structure and energy levels, frequency-dependent dielectric response, and element-specific radial distribution of atoms. Gatan offers devices and software to enhance and support scanning-mode TEM (STEM) analysis, including digital beam scan and imaging systems, STEM detectors optimized for the STEM EELS technique, EDS data acquisition and analysis software, spectral imaging and analysis software. Gatan manufactures cathodoluminescence imaging systems, spectroscopy and spectrum imaging systems, cryo-SEM equipment. Gatan offers software suite for EELS and EFTEM compositional mapping, TEM auto-tuning, diffraction pattern analysis, and 3D tomography-acquisition. Gatan manufactures a specially designed ultra-microtome for life science researchers, operating in situ within a variable pressure, field emission SEM, allowing automated acquisition of 3D ultrastructure by sequentially imaging the freshly cut, resin embedded block face. Gatan also manufactures the SEM-hosted high resolution X-ray microscope providing an internal view of the structure of samples without cross-sectioning (X-ray microscopy + scanning electron microscopy = 3D tomographic imaging).
IXRF Systems, Inc.
IXRF Systems is a manufacturer of EDS microanalysis and imaging systems for electron microscopes, EDS detectors, EDS system upgrades, integrated X-ray fluorescence microanalysis systems for scanning electron microscopes (integrated XRF analysis in the SEM). IXRF Systems manufactires a complete EDS systems, EDX/EDS microanalysis systems, upgrades for existing EDS systems, EDS detector upgrades, such as light element windows, crystal changes. IXRF Systems manufactures X-ray fluorescence (XRF) microanalysis instruments for scanning electron microscopes: collimated X-ray source providing a 500 micron to 5mm X-ray spot analysis in the SEM, and micro-XRF analyzer system (X-ray spot sizes around 40-60 microns or larger). The key benefit is a reduced background - very low elemental analysis (ppm) can be performed. The X-ray fluorescence (XRF) microanalysis instruments uses SEM stages for creating elemental maps at the ppm level. The micro-EDXRF spectrometer system for scanning electron microscopes incorporates a polycapillary focusing optic to focus the x-ray beam, creating an excitation area of about 40 microns. The collimated X-ray source for SEM and micro-XRF spectrometer system can be adapted to just about any electron microscope and used with any EDS system.
JEOL Ltd is a manufacturer of transmission electron microscopes (TEM systems), scanning electron microscopes (SEM systems), electron probe micro analyzers (EPMA), Auger microprobe analyzers (AES), scanning probe microscopes (SPM systems), X-Ray  photoelectron spectrometers (XPS systems), nuclear magnetic resonance spectometers, electron spin resonance spectormeters, mass-spectrometers, MS/MS, GC/MS systems, LC/MS systems, X-ray fluorescence spectrometers, amino acid analyzers, clinical biochemistry analyzers, laboratory information systems. JEOL manufactures a broad range of electron microscopes and surface microanalysis instruments, including: transmission electron microscopes, scanning electron microscopes, analytical scanning electron microscopes (SEM + optional energy dispersive X-ray spectrometer, EDS for elemental analysis), scanning probe microscopes, field emission Auger microprobe analyzers, electron probe microanalyzers (EPMA, up to 5 energy dispersive X-ray spectrometers for elemental analysis), X-Ray photoelectron spectrometers. JEOL manufactures double-focusing magnetic sector mass spectrometers and MS-MS systems, dioxin analysis MS system, magnetic sector GC-MS system, quadrupole GC-MS system, TOF GC-MS system, and TOF API HPLC-MS system. JEOL manufactures high performance, research grady nuclear magnetic resonance spectometers, electron spin resonance spectormeters (high resolution NMR spectrometers, ESR spectrometers). JEOL manufactures X-ray fluorescence spectrometers (XRF spectrometer). JEOL also manufactures amino acid analyzers, clinical biochemistry analyzers.
Kratos Analytical Limited.
Kratos Analytical Limited is a manufacturer of XPS instruments for surface analysis and mass-spectrometry instruments for life sciences (MALDI TOF MS systems for biochemical applications, proteomics, combinatorial chemistry). Kratos Analytical is a wholly owned subsidiary of the Shimadzu Corporation. Kratos Analytical manufactures a family of X-ray photoelectron spectrometers (XPS microanalysis systems) for surface analysis and imaging.
Oxford Instruments plc.
Oxford Instruments (UK) is a manufacturer of analytical instruments and scientific equipment. Oxford Instruments manufactures portable X-ray fluorescence instruments, handheld XRF metal analyzers, alloy testers (hand-held XRF analyzers for PMI, positive material identification, alloy analysis, alloy identification, RoHS, hazardous material analysis), laboratory XRF spectrometers (XRF sulfur in oil analyzer, sulphur in petroleum analyzers), coating thickness and material composition measuring instruments (coating gauges, XRF coating analyzers), optical emission metal analyzers, OES alloy testers (mobile OES metal analyzers, OES PMI systems,OES alloy sorters, laboratory high performance OES metal analyzers). Oxford Instruments manufactures X-ray microanalysis attachments, microspectrometer systems for scanning electron microscopes, SEM systems, transmission electron microscopes, TEM systems (EDS, energy dispersive microanalysis system, WDS, wavelength dispersive microanalysis system, EBSD, electron backscatter diffraction microanalysis system). Oxford Instruments manufactures X-ray tubes and components (low power X-ray tubes, small focal spot X-ray tubes, highly stable X-ray tubes, mono-blocks packaged X-ray tubes, microfocus X-ray source, portable X-ray sources).
Parallax Research, Inc.
Parallax Research is a manufacturer of X-ray microanalysis instruments (X-ray microspectrometers), X-ray optics and X-ray components for scanning electron microscopes, transmission electron microscopes, electron probe microanalyzers, Auger microanalyzers. Parallax Research manufactures wavelength dispersive microspectrometers (WDS), energy dispersive microspectrometers (EDS) and WDS + EDS microanalysis package for SEM and TEM systems, electron probe microanalyzers (EPMA), Auger microanalyzers. The company specializes in low energy (light elements) X-ray microanalysis. Parallax Research manufactures attachable low-energy X-ray optic for energy dispersive microspectrometers. Parallax Research also manufactures proportional counters for use in X-ray microanalysis instruments and XRF spectrometers, components for interfacing X-ray microanalysis instruments to SEM systems.
Shimadzu Corporation.
Shimadzu Corporation is one of the world's leading analytical instrument and scientific instrument companies, a manufacturer of analytical equipment (gas chromatography, liquid chromatography instruments and systems, portable ion chromatography systems, mass spectrometry, optical spectroscopy, X-Ray spectroscopy instruments and systems, elemental analyzers, thermal analyzers), laboratory equipment (electronic laboratory balances, analytical balances, moisture determination balances - balance moisture analyzers), measuring equipment (calorimeters, moisture meters, viscometers, rheometers, particle size analyzers, force gauges, specific gravity meters), scientific equipment (XRF spectrometers, X-ray diffractometers, surface analysis instruments: scanning electron microscopes, scanning probe microscopes), materials testing equipment (material testing machines, hardness tester systems).
Shimadzu Corporation manufactures a broad range of elemental analysis and spectroscopy equipment, instruments, systems: TC, TN, TIC, TOC analyzers (total carbon analysers, total nitrogen analyzers, total inorganic carbon analysers, total organic carbon analyzers), atomic-absorption spectrometers (flame and graphite furnace AAS instruments), spark optical emission spectrometers for metal analysis and alloy identification (OES metal analyzers), ICP spectrometers, FT-IR spectrometers and FTIR microscopes (FT-IR microanalysis systems), UV-visible spectrophotometers, fluorescence spectrometers, MALDI-TOF mass spectrometry systems, X-ray fluorescence spectroscopy and X-ray diffractometry instruments (X-ray fluorescence spectrometers and X-ray diffractometers), optical components (holographic gratings), consumable products, parts and accessories for spectroscopy and elemental analysis.
Shimadzu Corporation manufactures scanning electron microscopes (SEM systems), analytical scanning electron microscopes (SEM-EDX combined microanalysis system), scanning probe electron microscopes (SPM systems), electron probe microanalyzer (EPMA), and energy dispersive micro X-ray fluorescence spectrometer (micro-EDXRF spectrometer system).
South Bay Technology, Inc.
South Bay Technology, Inc is a manufacturer of specimen preparation equipment and supplies for metallography, crystallography and electron microscopy. Since 1964 South Bay Technology, Inc manufactures specimen preparation equipment. South Bay Technology, Inc is a manufacturer of laboratory equipment for cutting and sectioning, lapping and polishing, crystal orientation, TEM sample preparation, metallographic supplies. South Bay Technology, Inc manufactures wire saws, diamond wheel saws, polishing machines, lapping machines, grinding machines, ion milling systems, plasma cleaners, ion beam sputter deposition, chromium coaters, RF plasma Etchers, RIE (reactive ion etchers), laue back reflections systems, goniometers and other equipment for precision specimen preparation.
SPECS Surface Nano Analysis GmbH.
SPECS Surface Nano Analysis GmbH (Berlin, Germany) is a manufacturer of specialized spectrometer systems for surface microanalysis and imaging (surface spectroscopy and microscopy systems). SPECS Surface Nano Analysis manufactures electron spectrometers, fully automated ESCA system, secondary ion mass spectrometry + secondary neutral mass spectrometry system (SIMS + SNMS system), X-ray  photoelectron spectrometer (ultra high resolution XPS analyzer), Auger spectrometer (AES system), electron energy loss spectrometer (EELS system), low energy electron microscopy + photoelectron emission microscopy system (LEEM + PEEM system), low energy electron diffraction analyzer (LEED surface analyzer), photoemission spectrometer, time-of-flight spectrometer, scanning tunneling spectroscopy and microscopy system (STM system). SPECS GmbH manufactures a line of high resolution hemispherical energy analyzers for electron and ion spectroscopy, non-contact atomic force microscopy instrumentation (NC-AFM system), the Joule-Thomson scanning tunneling microscope. SPECS GmbH offers customized systems combining thin film preparation (MBE) with spectroscopic and microscopic options. The company also manufactures a variety of sources for deposition, excitation and charge neutralization as well as analyzers, monochromators, detectors.
Author of the catalogue - Andrey Yurievich Zhdanov. Автор каталога - Андрей Юрьевич Жданов.
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Analytical and laboratory equipment companies, scientific instrument companies. Производители и поставщики аналитического и лабораторного оборудования.